OHO Eisaku
| Faculty of Engineering Department of Electrical and Electronic Engineering | Professor |
Career
- Apr. 2003 - Present
Kogakuin University, Faculty of Engineering, Department of Electrical Engineering - Apr. 1996 - Mar. 2003
Kogakuin University, Faculty of Engineering, Department of Electrical Engineering - Apr. 1990 - Mar. 1996
Kogakuin University, Faculty of Engineering, Department of Electrical Engineering - Apr. 1991 - Mar. 1992
コネチカット州立大学客員研究員 - Apr. 1987 - Mar. 1990
Kogakuin University, Faculty of Engineering, Department of Electrical Engineering
Educational Background
Degree
IDs
Identifiers
研究者番号：40194633
researchmap会員ID：1000071043
J-Global ID：200901022556581764
Research Field
Research Keyword
Books and other publications
- 生命の形と機能
Joint work
25 Oct. 2013
9784320034730 - 新・走査電子顕微鏡
Joint work
30 Jun. 2011
9784320034730 - Digital image-processing technology useful for scanning electron microscopy and its practical applications. ADVANCES IN IMAGING AND ELECTRON PHYSICS, Vol.122 (Ed. by Hawkes PW)
Eisaku Oho, Contributor
Elsevier Science, 2002 - 走査電子顕微鏡
Joint work
May 2000 - Digital image processing technology for SEM. ADVANCES IN IMAGING AND ELECTRON PHYSICS, Vol.105 (Ed. by Hawkes PW)
Contributor
1999 - 電子顕微鏡の上手な使い方講座III日本電子顕微鏡学会編
Joint work
Jul. 1992 - 先端材料評価のための電子顕微鏡技法日本電子顕微鏡学会関東支部編
Joint work
Nov. 1991 - 表面分析辞典日本表面科学会編
Joint work
Dec. 1986
Paper
- Technology for Fundamental Improvement of an Extremely Low-Quality Video Signal for Use in Fine Focusing and Astigmatism Correction in Scanning Electron Microscopy
Eisaku Oho; Sadao Yamazaki; and Kazuhiko Suzuki
SCANNING, 25 Jan. 2023, [Reviewed]
Lead - Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation
Eisaku Oho; Kazuhiko Suzuki; and Sadao Yamazaki
SCANNING, 15 Nov. 2021, [Reviewed]
Lead - Applying Fast Scanning Method Coupled with Digital Image Processing Technology as Standard Acquisition Mode for Scanning Electron Microscopy
Eisaku Oho; Kazuhiko Suzuki; and Sadao Yamazaki
SCANNING, 31 Mar. 2020, [Reviewed]
Lead - Support system for fine focusing and astigmatism correction using an auditory signal in scanning electron microscopy
Eisaku Oho; Kazuhiko Suzuki; Sadao Yamazaki
Microscopy, 01 Jun. 2017, [Reviewed], [Invited] - Special Raster Scanning for Reduction of Charging Effects in Scanning,Electron Microscopy
kazuhiko Suzuki; Eisaku Oho
SCANNING, 2014, [Reviewed]
MISC
- Feature Evaluation of Complex Hysteresis Smoothing and Its Practical Applications to Noisy SEM Images
Kazuhiko Suzuki; Eisaku Oho
SCANNING, Sep. 2013 - Highly Accurate SNR Measurement Using the Covariance of Two SEM Images With the Identical View
Eisaku Oho; kazuhiko Suzuki
SCANNING, Jan. 2012, [Reviewed] - Image Restoration for TV-Scan Moving Images Acquired Through a Semiconductor Backscattered Electron Detector
Eisaku Oho; Kazuhiko Suzuki
SCANNING, Nov. 2009 - Quality improvement of environmental secondary electron detector signal using helium gas in variable pressure scanning electron microscopy
Eisaku Oho; Kazuhiko Suzuki; Sadao Yamazaki
SCANNING, Sep. 2007 - An improved scanning method based on characteristics of the human visual system for SEM
Oho E; Sugawara T; Suzuki K
SCANNING, Jul. 2005, [Reviewed] - Mechanical Scanning of the Specimen in the Scanning Electron Microscope
Oho E; Miyamoto M
SCANNING, Jul. 2004, [Reviewed] - Reduction in acquisition time of scanning electron microscopy image using complex hysteresis smoothing
Oho E
SCANNING, Mar. 2004, [Reviewed] - Metrics for focusing in extremely noisy SEM condition
Oho E; Kawamura K; Hatakeyama T and Suzuki K
SCANNING, Jan. 2004, [Reviewed] - Digital image-processing technology useful for scanning, electron microscopy and its practical applications
E Oho
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 122, 2002 - Strategies for optimum use of superposition diffractogram in scanning electron microscopy
E Oho; K Toyomura
SCANNING, Sep. 2001 - Natural color SEM based on the frequency characteristic of human visual system.
著者:於保英作、渡辺真佐志
SCANNING, Jan. 2001, [Reviewed] - Image-quality improvement using helium gas in low-voltage variable pressure scanning electron microscopy.
著者:於保英作、浅井奈月、伊東祐博
J. Electron Microscopy, Nov. 2000, [Reviewed] - Practical SEM system based on the montage technique applicable to ultralow magnification observation.
著者:於保英作、奥川健二、川俣茂
J. Electron Microscopy, Jan. 2000, [Reviewed] - Histochemistry of food tissue by colour scanning electron microscopy
M Yamada; M Nishimura; T Suzuki; S Kawamata; E Oho; T Kimura
JOURNAL OF ELECTRON MICROSCOPY, 2000 - Digital image processing technology for scanning electron microscopy
OHO E.
ADVANCES IN IMAGING AND ELECTRON PHYSICS, 1999 - Colour scaqnning electron microscopy of peltate glandular trichomes of fresh developing hops.
著者:山田満彦、鈴木猛夫、於保英作、松島久
J.Electron Microscopy, Nov. 1998, [Reviewed] - New generation scanning electron microscopy technology based on the concept of active image processing
E Oho; Y Hoshino; T Ogashiwa
SCANNING, Oct. 1997 - Proper acquisition and handling of SEM images using a high-performance personal computer.
著者:於保英作、市瀬紀彦、小柏 剛
SCANNING, Apr. 1996, [Reviewed] - Practical method for noise removal in scanning electron microscopy
E Oho; N Ichise; WH Martin; KR Peters
SCANNING, Jan. 1996 - NECESSITY AND UTILITY OF A SCANNING ELECTRON-MICROSCOPE WITH 4,096 LINES
E OHO; N ICHISE; T OGASHIWA
JOURNAL OF ELECTRON MICROSCOPY, Oct. 1995 - PRACTICAL METHODS FOR DIGITAL IMAGE-ENHANCEMENT IN SEM
E OHO; KR PETERS
JOURNAL OF ELECTRON MICROSCOPY, Oct. 1994 - Automatic contrast adjustment for structural detail recognition in SEM images.
SCANNING, Dec. 1992, [Reviewed] - A method of noise removal using the inverse transform of autocorrelation function.
著者:馬場則男、於保英作、金谷光一
J.Electron Microsc.Tech, Dec. 1991, [Reviewed] - Two effective methods for enhancement of SE and BSE images.
著者:於保英作、金谷光一
SCANNING'91 SCANNING, May 1991 - Improved information transfer through homomorphic FFT filtering and thermal printing of high quality SEM images.
著者:於保英作、金谷光一
SCANNING'91 SCANNING, May 1991 - A method using on-line digital computer for improvement of resolution of back-scattered electron image.
著者:於保英作、荻原正徳、金谷光一
J.Microscopy, Apr. 1991, [Reviewed] - Two effective methods for enhancement of SE and BSE images.
1991 - A method of noise removal using the inverse transform of autocorrelation function.
1991 - A new nonlinear pseudo-Laplacian filter for enhancement of secondary electron image
著者:於保英作、金谷光一
J.Microscopy, Feb. 1990, [Reviewed] - Caustic patterns combined with second and third order astigmtism in high resolution SEM.
著者:金谷光一、於保英作、安達公一
Micron and Microscopica Acta, Feb. 1990, [Reviewed] - Cone formation theory of contamination high resolution TEM.
著者:金谷光一、於保英作、井上信宏
Micron and Microscopica Acta, Feb. 1990, [Reviewed] - A CONE FORMATION THEORY OF CONTAMINATION IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
K KANAYA; K YONEHARA; E OHO; N INOUE; M IZUMIDA
MICRON AND MICROSCOPICA ACTA, 1990 - A method using on- line digital computer for improvement of resolution of BSE images.
著者:於保英作、荻原昭徳、王 素利、金谷光一
3th Beijing Conf.on instrumental analysys, Aug. 1989 - Development of a nonlinear Laplacian filter using the combi nation of the second derivative along the direction of the local gradient and a non linear weight factor to high-resolution enhancementof SE images.
著者:於保英作、荻原昭徳、王 素利、金谷光一
3th Beijing Conf.on instrumental analysys, Aug. 1989 - A method using on- line digital computer for improvement of resolution of BSE images.
1989 - An algorithm for assisting automatic astigmatism correction using diffractograms based on the projection theory.
著者:小笠原光男、馬場則男、於保英作、金谷光一
EUREM 88(Eur.Cong.on Electron Microsc)pp.199-200, Aug. 1988 - A contamination reducing method by ionbeam bombardment with the specimen in high resolution electron microscopy.
著者:金谷光一、於保英作、水越信明
EUREM 88(Eur.Cong.on Electron Microsc)pp.199-200, Aug. 1988 - A contamination reducing method by ionbeam bombardment of the specimen in high-resolution electron microscopy.
著者:金谷光一、於保英作、織田 誠
Micron and Microscopica Acta, Jul. 1988, [Reviewed] - Applications of ion beam sputtering for specimen preparati on high-resolution electron microscopy.
著者:金谷光一、馬場則男、於保英作
12th Scanning Microscopy, Apr. 1988 - Fundamental techniques in digital processing of electron microscopy images.
著者:金谷光一、佐々木俊英、於保英作
6th Pfefferkorn Conf. on image and signal processing., Apr. 1988 - Development of practical on-line digital image processing techniques for scanning electron microscopy.
OHO Eisaku; OGIHARA Akinori; KANAYA Koichi
J. Surf. Sci. Soc. Jpn., 1988 - Fundamental techniques in digital processing of electron microscopy images.
1988 - A CONTAMINATION-REDUCING METHOD BY ION-BEAM BOMBARDMENT OF THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
K KANAYA; E OHO; A OGIHARA
JOURNAL OF ELECTRON MICROSCOPY, 1988 - A CONTAMINATION REDUCING METHOD BY ION-BEAM BOMBARDMENT WITH THE SPECIMEN IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
K KANAYA; E OHO; N MIZUKOSHI
EUREM 88, VOLS 1-3, 1988 - AN ALGORITHM FOR ASSISTING AUTOMATIC ASTIGMATISM CORRECTION USING DIFFRACTOGRAMS BASED ON THE PROJECTION THEORY
M OGASAWARA; N BABA; E OHO; K KANAYA
INSTITUTE OF PHYSICS CONFERENCE SERIES, 1988 - AN ALGORITHM FOR ONLINE DIGITAL IMAGE-PROCESSING FOR ASSISTING AUTOMATIC FOCUSING AND ASTIGMATISM CORRECTION IN ELECTRON-MICROSCOPY
N BABA; E OHO; K KANAYA
SCANNING MICROSCOPY, Dec. 1987 - An improvement in digital homomorphic filtering and its practical applications
著書:於保英作、佐々木俊英、荻原正徳、金谷光一
SCANNING, Oct. 1987, [Reviewed] - Image formation of STEM based on the information transmission theory.
著者:金谷光一、馬場則男、於保英作、佐々木俊英
The Int.Sympo.on Electron Optics, Aug. 1987 - An algorithm for on-line digital image processing for assist automatic focusing and astigmatism corre ction in electron microscopy.
著者:馬場則男、於保英作、金谷光一
SCANNING MICROSCOPY, May 1987, [Reviewed] - THE CONVERSION OF A FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE TO A HIGH-RESOLUTION, HIGH-PERFORMANCE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE, WHILE MAINTAINING ORIGINAL FUNCTIONS
E OHO; M BABA; N BABA; Y MURANAKA; T SASAKI; K ADACHI; M OSUMI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, May 1987 - THE CONVERSION OF A FIELD-EMISSION SCANNING ELECTRON-MICROSCOPE TO A HIGH-RESOLUTION, HIGH-PERFORMANCE SCANNING-TRANSMISSION ELECTRON-MICROSCOPE, WHILE MAINTAINING ORIGINAL FUNCTIONS
A OGIHARA; E OHO; Y MURANAKA; K ADACHI; M OSUMI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY, 1987 - Image formation of STEM based on the information transmission theory.
1987 - AN INEXPENSIVE AND HIGHLY EFFICIENT DEVICE FOR OBSERVING A TRANSMITTED ELECTRON IMAGE IN SEM
E OHO; T SASAKI; K ADACHI; Y MURANAKA; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, Jan. 1987 - A comparison of on-line digital recording to conventional photo graphic recording for scanning electron microscopy.
著者:於保英作、佐々木俊英、金谷光一
J.Electron Microsc.Tech, Oct. 1986, [Reviewed] - Digital image processings for noperiodic objects and an on-line image processing system for highresolution electron microscopy.
著者:馬場則男、於保英作、向井万起男
J.Electron Microsc.Tech, Oct. 1986, [Reviewed] - A STEM suitable for the observation of biological specimens: The field emission gun SEM equipped with an improved transmitted mode.
著者:於保英作、馬場美鈴、馬場則男、佐々木俊英、達 公一、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - On-line digital image processing for optimization of high resolution electron microscopy.
著者:馬場則男、於保英作、佐々木俊 、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - Image formation of scanning transmission electron microscope based on the informa tion transmission theory.
著者:金谷光一、馬場則男、於保英作、佐々木俊英
11th Int.Cong.on Electron Microsc., Jul. 1986 - Application of digital image processings considered on characteristics of SEM images.
著者:於保英作、佐々木俊英、馬場則男、村中省吾、大隅正子、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - An inexpensive and highly efficient devic for observing a STEM image in the SEM.
著者:於保英作、佐々木俊英、安達公一、村中省吾、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - Automatic measureme of SEM beam diameter using an on-line digit computer.
著者:於保英作、佐々木俊英、安達公一、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - Uncoated observati on of biological speci menby ion beam pre-bom badment in highresolution scanning electron microscopy.
著者:於保英作、村中省吾、馬場則男、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - Non-linear quantization in digitizing the electron micrographs.
著者:佐々木俊英、於保英作、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - The superiority of an on-line digital recording system for and STEM to the conventional system.
著者:佐々木俊英、於保英作、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - Inverse transform of an image autocorrelation function and applications.
著者:馬場則男、於保英作、金谷光一
11th Int.Cong.on Electron Microsc., Jul. 1986 - On-line digital image processing for optimization of high resolution electron microscopy.
1986 - A STEM suitable for the observation of biological specimens: The field emission gun SEM equipped with an improved transmitted mode.
1986 - Inverse transform of an image autocorrelation function and applications.
1986 - The superiority of an on-line digital recording system for and STEM to the conventional system.
1986 - Image formation of scanning transmission electron microscope based on the informa tion transmission theory.
1986 - Non-linear quantization in digitizing the electron micrographs.
1986 - Uncoated observati on of biological speci menby ion beam pre-bom badment in highresolution scanning electron microscopy.
1986 - Automatic measureme of SEM beam diameter using an on-line digit computer.
1986 - An inexpensive and highly efficient devic for observing a STEM image in the SEM.
1986 - Application of digital image processings considered on characteristics of SEM images.
1986 - Digital image processing for nonperiodic objects and an on‐line image processing system for high resolution electron microscopy
Norio Baba; Eisaku Oho; Makio Mukai; Koichi Kanaya
Journal of Electron Microscopy Technique, 1986 - AUTOMATIC-MEASUREMENT OF SCANNING BEAM DIAMETER USING AN ONLINE DIGITAL-COMPUTER
E OHO; M KOBAYASHI; T SASAKI; K ADACHI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986 - A COMPARISON OF ONLINE DIGITAL RECORDING WITH CONVENTIONAL PHOTOGRAPHIC RECORDING FOR SCANNING ELECTRON-MICROSCOPY
E OHO; T SASAKI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986 - Computer process for image enhancement and three-dimensional reconstruction.
著者:馬場則男、於保英作、金谷光一
J.Chinese Electron Microsc.Soci, Dec. 1985, [Reviewed] - Removal of the effect of contamination in SEM image by the homomorphic filter
著者:於保英作、佐々木俊英、金谷光一
J.Electron Microsc., Oct. 1985, [Reviewed] - Optimization of high-resolution electron microscopy by on-line digital image processing.
著者:馬場則男、於保英作、田辺寛一、木村 力、金谷光一
Bejing Conf and Exhibition on Instrumental Analysis, Jul. 1985 - Measurement of electron probe diameter by digital image processiing
著者:於保英作、佐々木俊英、金谷光一
J.Electron Microsc.Tech, Apr. 1985, [Reviewed] - Digital image processingmethods for improvement of quality of high-resolution secondary electron images.
OHO Eisaku; SASAKI Toshihide; KANAYA Koichi
J. Surf. Sci. Soc. Jpn., 1985 - MEASUREMENT OF ELECTRON-PROBE BEAM DIAMETER BY DIGITAL IMAGE-PROCESSING
E OHO; T SASAKI; K ADACHI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985 - Optimization of high-resolution electron microscopy by on-line digital image processing.
1985 - Computer process for image enhancement and three-dimensional reconstruction.
1985 - REMOVAL OF THE EFFECTS OF CONTAMINATION IN SEM IMAGE BY HOMOMORPHIC FILTERING
E OHO; T SASAKI; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY, 1985 - AN IMAGE-PROCESSING METHOD FOR SCANNING ELECTRON-MICROSCOPY BASED ON THE INFORMATION-TRANSMISSION THEORY
K KANAYA; E OHO; M NAKA; T KOYANAGI; T SASAKI
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1985 - Three-dimensional observation of the prolamellar bodies in etioplasts of squash Cucurbita moschata.
著者:大隅正子、山田直子、長野美鈴、金谷光一、馬場則男、於保英作
SCANNING ELECTRON MICROSC., May 1984, [Reviewed] - AN IMAGE-PROCESSING METHOD FOR SCANNING ELECTRON-MICROSCOPY BASED ON THE INFORMATION-TRANSMISSION THEORY
E OHO; M NAKA; T SASAKI; K KANAYA; K ADACHI
JOURNAL OF ELECTRON MICROSCOPY, 1984 - 3-DIMENSIONAL OBSERVATION OF THE PROLAMELLAR BODIES IN ETIOPLASTS OF SQUASH CUCURBITA-MOSCHATA
M OSUMI; N YAMADA; M NAGANO; S MURAKAMI; N BABA; E OHO; K KANAYA
SCANNING ELECTRON MICROSCOPY, 1984 - APPLICATION OF THE LAPLACIAN FILTER TO HIGH-RESOLUTION ENHANCEMENT OF SEM IMAGES
E OHO; N BABA; M KATOH; T NAGATANI; M OSUMI; K AMAKO; K KANAYA
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984 - Digital processing scanning electron micrographs by using scanning densitometer system.
著者:金谷光一、甲斐幹生、於保英作、篠原千春
10th Int.Cong.on Electron Microsc., May 1983 - Digital processing scanning electron micrographs by using scanning densitometer system.
1983 - PREPARATION FOR OBSERVATION OF FINE-STRUCTURE OF BIOLOGICAL SPECIMENS BY HIGH-RESOLUTION SEM
N YAMADA; M NAGANO; S MURAKAMI; M IKEUCHI; E OHO; N BABA; K KANAYA; M OSUMI
JOURNAL OF ELECTRON MICROSCOPY, 1983 - DIGITAL PROCESSING METHODS USING SCANNING DENSITOMETER AND MICROCOMPUTER FOR THE STRUCTURAL-ANALYSIS OF A SCANNING ELECTRON MICROGRAPH
K KANAYA; N BABA; M KAI; E OHO; Y MURANAKA
SCANNING ELECTRON MICROSCOPY, 1982
Lectures, oral presentations, etc.
- 様々なSEM操作条件下で表面微細構造の変形を正確に測定するための新しい相関係数法
05 Jun. 2024 - 信頼度の高いSEM像を得るための特殊な画像積算技術と組み合わせた高速スキャン法
05 Jun. 2024 - ノイズの多い低真空SEM条件下で試料損傷の程度を調べるための高信頼性手法
04 Jun. 2024 - SEM像から得られたSN比マップ画像による汎用SEMのためのノイズ除去技術の評価
04 Jun. 2024 - SEM試料の性質や装置の操作条件を考慮した合焦動作用画像信号の適正取得
04 Jun. 2024 - 画像処理技術と組み合わせたSEMのための高速スキャンシステムの効果的な活用方法
26 Jun. 2023 - SEM試料の性質に起因するフォーカス動作用信号の変動抑制
26 Jun. 2023 - SEM像から得られた分割画像へのノイズ成分の影響を受けない相関係数法の適用
26 Jun. 2023 - SEM像から得られたSN比マップ画像の特性とその潜在的利用価値
26 Jun. 2023 - SEMノイズ成分に影響されず試料損傷の程度を調べるための相関係数を得る高信頼性手法
12 May 2022 - 画像処理技術と組み合わせたSEMのための高速スキャンシステムの実用化に向けて
12 May 2022 - 畳み込みニューラルネットワークを用いた汎用SEMのためのノイズ除去技術の評価
12 May 2022 - SEM像から得られた細分割画像によって生成されたSN比マップ画像とその潜在的利用価値
12 May 2022 - 可変圧力SEMの有効活用におけるSEMノイズに,影響されない相関係数を用いた試料損傷測定
16 Jun. 2021 - 汎用SEMのための畳み込みニューラルネットワークを用いたノイズ除去技術とその問題点
16 Jun. 2021 - SEM像から得られた適正分割画像のSN比測定の必要性
16 Jun. 2021 - デジタル画像処理技術と組み合わせたSEMのための高性能高速スキャン法
16 Jun. 2021 - SEMの標準取得モードとしてのデジタル画像処理技術と組み合わせた高速走査法の提案
25 May 2020 - 畳み込みニューラルネットワークを用いたSEM像のノイズ除去とその画質評価
25 May 2020 - SEMの焦点合わせと非点補正に用いる超低品質信号改善技術の実用化
25 May 2020 - Fast Scanning Method Applicable as a Standard Acquisition Mode for SEM
Eisaku Oho; Kazuhiko Suzuki and Sadao Yamazaki
日本顕微鏡学会第62回シンポジウム, 30 Nov. 2019 - Noise removal for SEM images using a convolutional neural network
Kazuhiko Suzuki; Eisaku Oho and Sadao Yamazaki
日本顕微鏡学会第62回シンポジウム, 30 Nov. 2019 - Technology for fundamentally improving an extremely low-quality video signal used for fine focusing and astigmatism correction in scanning electron microscopy
Sadao Yamazaki; Kazuhiko Suzuki and Eisaku Oho
日本顕微鏡学会第62回シンポジウム, 30 Nov. 2019 - 多様なSEM信号の品質を適切に評価するためのSN比とeSN比
19 Jun. 2019 - 畳み込みニューラルネットワークを用いたSEM像のノイズ除去とその利点
19 Jun. 2019 - 走査電子顕微鏡の合焦支援システムにおける活用を視野に入れた信号品質改善技術
19 Jun. 2019 - 連続取得高速走査SEM像のための位置合わせと適切な積算回数の検出を伴う画像積算技術
18 Jun. 2019 - 可変圧力SEMの有効活用を目的とした入射電流と画質の測定
17 Jun. 2019 - 十分なSN比を維持するSEM像取得法と能動形ハイライトフィルタへの応用
16 Mar. 2019 - 可変圧力SEMの活用に必要な入射電流・SN比・試料質量変化の測定
16 Mar. 2019 - 畳み込みニューラルネットワークを利用したSEM像ノイズ除去法の性能・特性評価
16 Mar. 2019 - 高速走査のメリットを十分に発揮させるための適正画像処理技術
16 Mar. 2019 - 高速走査SEMと低速走査SEM間の画像品質の客観的比較
30 May 2018 - 低画質動作条件下で使用する低真空SEMの利用範囲の拡大
30 May 2018 - SN比、eSN比を正しく測定するためのSEM装置の重要な条件
29 May 2018 - 能動形画像処理の考え方に基づいた十分なSN比を維持するSEM像取得法
29 May 2018 - SEMの高精度焦点合わせと非点収差補正に用いる超低SN比信号の品質改善技術
29 May 2018 - SEM像の画質を評価するための有効信号対雑音比（eSN比）
10 Mar. 2018 - 低真空SEMの画質客観評価と利用範囲の拡大
10 Mar. 2018 - 試料の性質を考慮した常に十分なSN比を維持するためのSEM像取得法
10 Mar. 2018 - 聴覚信号を用いたSEMのための合焦支援システム
10 Mar. 2018 - 聴覚信号を用いたSEMの高精度焦点合わせと非点収差補正のための支援システム
01 Jun. 2017 - 走査電子顕微鏡で常に十分な信号対雑音比を維持する像取得法
01 Jun. 2017 - 走査電子顕微鏡での利用に適した有効信号対雑音比
01 Jun. 2017 - SEMの実効的な信号に基づいたSN比とその測定方法
16 Jun. 2016 - SEMにおける信号依存ノイズの低減とその評価
16 Jun. 2016 - 人間の聴覚を利用したSEM用焦点合わせ支援システムの改良
16 Jun. 2016 - SEM信号の性質を考慮したComplex Hysteresis Smoothingの改良
15 May 2015 - 人間の聴覚を利用したSEM用焦点合わせ支援システムの特長
15 May 2015 - ＳＥＭ像共分散を用いるＳＮ比測定法の改良と性能評価
15 May 2015 - 非線形加減速を用いた高速機械式走査によるSEMの広領域観察
14 May 2015 - 人間の聴覚を活用するSEM用焦点合わせ支援システム
28 Feb. 2015 - SEM像共分散を用いるSN比測定法の性能評価
28 Feb. 2015 - 高速機械式走査を併用したSEMの非線形加減速における像取得
28 Feb. 2015 - 機械式走査用SEM試料ステージの加速度計測による振動評価
28 Feb. 2015 - SEM用ノイズ除去フィルタCHSの性能向上とその応用
28 Feb. 2015 - Ultrahigh quality SEM images of biological samples using a long acquisition time and complex hysteresis smoothing
Eisaku Oho; Kazuhiko Suzuki
XXIII INTERNATIONAL SYMPOSIUM ON MORPHOLOGICAL SCIENCES (Niigata), 11 Sep. 2013 - Reduction of charging effects in biological samples using a special raster scanning
Eisaku Oho; Kazuhiko Suzuki
XXIII INTERNATIONAL SYMPOSIUM ON MORPHOLOGICAL SCIENCES (Niigata), 11 Sep. 2013 - Feature evaluation of complex hysteresis smoothing
21 May 2013 - Special raster scanning for reduction of,charging effects in SEM
21 May 2013 - PSDを用いた試料ステージの位置検出
20 May 2013 - 高速機械式走査を装備したSEM による広視野観察
20 May 2013 - Special raster scanning for reduction of charging effects in SEM
2013 - Ultrahigh quality SEM images of biological samples using a long acquisition time and complex hysteresis smoothing
2013 - Reduction of charging effects in biological samples using a special raster scanning
2013 - 人間の視覚特性と画像処理技術を有効活用した走査電子顕微鏡
10 Mar. 2012 - 走査電子顕微鏡の画質評価と画質改善
10 Mar. 2012 - 視覚と聴覚を利用したSEM用手動焦点合わせ支援システム
16 May 2011 - 低真空SEMにおける高速走査BSE像の画像修復
16 May 2011 - 流体によるSEMステージ高速駆動の検討
16 May 2011 - マイクロステップ駆動パルスモータによるSEMステージ位置決め精度の検討
16 May 2011 - SEMにおけるCHSの効果的な利用のための処理パラメータ決定法
16 May 2011 - 3D-scanning electron microscopy for biological samples with the functions of image observation, reconstruction and quantitative measurement
Kazuhiko Suzuki
XXI INTERNATIONAL SYMPOSIUM ON MORPHOLOGICAL SCIENCES (Italy), 20 Sep. 2010 - Advanced scanning electron microscopy for ultrahigh quality observation of biological samples
Kazuhiko Suzuki
XXI INTERNATIONAL SYMPOSIUM ON MORPHOLOGICAL SCIENCES (Italy), 20 Sep. 2010 - TV-走査半導体BSE検出器信号のための周波数改善技術の実用化
24 May 2010 - コントラスト正規化法を用いたComplex Hysteresis Smoothing filter の改善
24 May 2010 - 3D-scanning electron microscopy for biological samples with the functions of image observation, reconstruction and quantitative measurement
2010 - Advanced scanning electron microscopy for ultrahigh quality observation of biological samples
2010 - Reduction in acquisition time of SEM image using complex hysteresis smoothing
Jun. 2004 - Image quality improvement and its quantitative measurement using helium gas in variable pressure scanning electron microscopy equipped with various detectors
Jun. 2004 - SEMを基本としたマルチモー,ダル顕微鏡の可能性について
Jun. 2003 - SEMを基本としたマルチモー ダル顕微鏡の可能性について
2003 - PC制御SEMを活用した, 走査電子顕微鏡性能の向上
May 2002 - PC制御SEMを活用した 走査電子顕微鏡性能の向上
2002 - New digital image processing technology for FSEM microscopy.
著者:KR Peters、於保英作
51st MSA, Jun. 1993 - New digital image processing technology for FSEM microscopy.
1993 - Digital imaging with field emission scanning electron microscopes (FSEM).
著者:KR Peters、於保英作
50th MSA(Microscopical Society of America,, Jun. 1992 - Digital imaging with field emission scanning electron microscopes (FSEM).
1992
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Member History
