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SAKAMOTO Tetsuo

School of Advanced Engineering　Department of Applied PhysicsProfessor

  • E-Mail: ct13087ns.kogakuin.ac.jp

Career

  • Apr. 2025 - Present
    日本学術振興会R073先端計測分析技術の未来創成委員会
  • Apr. 2025 - Present
    工学院大学大学院
  • Apr. 2015 - Present
    工学院大学先進工学部応用物理学科・教授
  • Apr. 2012 - Present
    工学院大学大学院電気・電子工学専攻・教授
  • Apr. 2019 - Mar. 2020
    先進工学部
  • Apr. 2018 - Aug. 2018
    東京大学 「応用化学特論第６」非常勤講師
  • Apr. 2017 - Mar. 2018
    工学院大学大学院電気・電子工学専攻・副専攻長
  • Apr. 2016 - Mar. 2018
    株式会社 トヤマ 技術顧問
  • Apr. 2012 - Mar. 2018
    Kogakuin University, Faculty of Engineering, Department of Electrical Engineering
  • Apr. 2011 - Mar. 2012
    Kogakuin University, Faculty of Engineering, Department of Electrical Engineering
  • Oct. 2004 - Mar. 2012
    工学院大学大学院電気・電子工学専攻・助教授
  • Apr. 2010 - Mar. 2011
    Kogakuin University, Faculty of Informatics, Department of Information Design
  • Apr. 2007 - Mar. 2010
    Kogakuin University, Faculty of Engineering, Department of Electrical Engineering
  • Apr. 2006 - Mar. 2007
    Kogakuin University, Faculty of Engineering, Department of Electrical Engineering
  • Oct. 2004 - Mar. 2006
    Kogakuin University, Faculty of Engineering, Department of Electronic Engineering
  • Jun. 2004 - Sep. 2004
    The University of Tokyo, Institute of Industrial Science
  • Apr. 1999 - May 2004
    The University of Tokyo, Environmental Science Center
  • Apr. 2000 - Mar. 2004
    成蹊大学・工学部・非常勤講師（計算機利用法Ⅰ、同Ⅱ）
  • Mar. 1999 - Mar. 1999
    The University of Tokyo, Institute of Industrial Science
  • Apr. 1997 - Feb. 1999
    日本学術振興会・特別研究員

Educational Background

  • Apr. 1994 - Mar. 1997
    The University of Tokyo
  • Apr. 1989 - Mar. 1992
    Yokohama National University, Faculty of Engineering

Degree

  • Mar. 1997
    Doctor of Engineering, The University of Tokyo

Affiliated academic society

  • May 2023 - Present
    日本原子力学会（正会員）
  • Mar. 2015 - Present
    日本鉄鋼協会、鋼中水素分析フォーラム
  • Mar. 2014 - Present
    （社）日本鉄鋼協会
  • Apr. 2013 - Present
    エアロゾル学会
  • Oct. 2011 - Present
    大気環境学会
  • Apr. 2009 - Present
    (独)日本学術振興会マイクロビームアナリシス第１４１委員会
  • Apr. 2002 - Present
    日本化学会
  • Feb. 1996 - Present
    日本分析化学会
  • Sep. 1992 - Present
    応用物理学会
  • 日本環境化学会

IDs

  • Identifiers

    研究者番号：20313067
    researchmap会員ID：1000292140
    J-Global ID：200901044936029286

Research Field

  • Nanotechnology/Materials, Analytical chemistry, Analytical chemistry
  • Life sciences, Morphology, anatomy, Compositional Imaging of Cells
  • Nanotechnology/Materials, Green/sustainable/environmental chemistry
  • Manufacturing technology (mechanical, electrical/electronic, chemical engineering), Electronic devices and equipment
  • Nanotechnology/Materials, Thin-film surfaces and interfaces
  • Nanotechnology/Materials, Nanomaterials

Research Keyword

  • SIMS
  • Instrumental Development
  • Surface Analysis
  • FIB

Books and other publications

Paper

MISC

  • Analysis of Surfaces and Interiors of Fine Particles Using FIB-TOF-SIMS
    Tetsuo SAKAMOTO
    Vacuum and Surface Science, 10 Mar. 2022, [Invited]
    https://www.jstage.jst.go.jp/article/vss/65/3/65_20180858/_pdf
    Lead
  • 数億年の知恵
    05 Oct. 2021, [Reviewed], [Invited]
    Last
  • 「観ること」の大切さ（巻頭緒言）
    30 Nov. 2019, [Invited]
  • PM2.5や黄砂粒子を一つ一つ観察できる携帯型粒子捕集装置
    10 Jun. 2017
  • 集束イオンビーム／レーザーイオン化法による単一微粒子の履歴解析
    01 Feb. 2015
  • 新型顕微鏡で見た黄砂とPM2.5
    31 Jan. 2015
  • 新型顕微鏡で見るPM2.5の正体
    01 Jan. 2015
  • 研究室紹介
    20 Sep. 2014
  • ナノスケールの物質計測と物質制御：PM2.5分析顕微鏡と有機ELデバイスの開発
    10 Jul. 2014
  • レーザーイオン化SNMS による高分子表面のイメージング法の開発
    Mar. 2014
  • 高分解能TOF-SIMSによるPM2.5粒子の個別粒子分析
    10 Aug. 2013
  • 高分解能飛行時間型二次イオン質量分析装置によるエアロゾルの個別粒子計測
    05 Aug. 2013
  • 高面方向分解能二次イオン質量分析装置の開発とエアロゾル、工業材料への応用
    05 Jul. 2013
  • Analysis of Fine Aerosol Particles Containing Black Carbon by High Lateral Resolution TOF-SIMS
    Norihito Mayama; Yusuke Miura; Kentaro Misawa; Akinori Takami; Tetsuo Sakamoto and Masaaki Fujii
    Analytical Sciences, 10 Apr. 2013, [Reviewed]
  • Development of FIB-TOF-SIMS Apparatus and Application to Aerosol Particle Analysis
    Tetsuo Sakamoto
    Proceedings of the 31st Symposium on Materials Science and Engineering Research Center of Ion Beam Technology Hosei University, Mar. 2013, [Reviewed]
  • Analysis of LiCoO2, CoO, and Co3O4 using FIB-TOF-SIMS
    Miwa Ohnishi and Tetsuo Sakamoto
    Proceedings of the 31st Symposium on Materials Science and Engineering Research Center of Ion Beam Technology Hosei University, Mar. 2013, [Reviewed]
  • Analysis of black carbon particles by high-resolution TOF-SIMS
    Norihito Mayama; Yusuke Miura; Kenji Ohishi; Tetsuo Sakamoto and Masaaki Fujii
    Technical Reports of the Meteorological Research Institute, Feb. 2013
  • Analysis of source apportionment and chemical transformation of particles in trans-boundary air pollution using high lateral resolution imaging SIMS
    Tetsuo Sakamoto; Kenji Ohishi; Yusuke Miura; Masaaki Fujii; Kentaro Misawa; Norihito Mayama; Mikko Riese; Kana Kitatsugu; Akinori Takami; Satoshi Irei; Shiro Hatakeyama; Ayako Yoshino; Kentaro Murano; Takuma Mukaida; Hiroshi Bandow and Yasuhiro Sadanaga
    Technical Reports of the Meteorological Research Institute, Feb. 2013
  • Laser post-ionization mass spectrometry of PAHs on diesel soot particles
    Kenji Ohishi; Norihito Mayama; Kana Kitatsugu; Kentaro Misawa; Tetsuo Sakamoto and Masaaki Fujii
    Technical Reports of the Meteorological Research Institute, Feb. 2013
  • Analysis of Fine Aerosol Particles Containing Black Carbon by High Lateral Resolution TOF-SIMS
    2013
  • ディーゼル粒子の内部混合状態を探る2
    Dec. 2012
  • ディーゼル粒子の内部混合状態を探る1
    30 Sep. 2012
  • Quantitative Determination of Composition of Particle Type by,Morphology of Nanoparticles in Diesel Exhaust and Roadside Atmosphere
    Yuji Fujitani1; Tetsuo Sakamoto and Kentaro Misawa
    Journal of Civil & Environmental Engineering, 24 Sep. 2012, [Reviewed]
  • エレクトロスプレー堆積法による積層型有機ELの製作
    24 May 2012, [Reviewed]
  • 2E0939 Structural Analysis of Environmental Particles Using Laser Ionization/TOF-SIMS(1 Space-5 East Asia,General Presentations)
    MISAWA Kentaro; MAYAMA Norihito; OHISHI Kenji; SAKAMOTO Tetsuo; TAKAMI Akinori; MURANO Kentaro; YOSHINO Ayako; HATAKEYAMA Shiro; BANDOW Hiroshi; FUJII Masaaki
    2012
  • Quantitative Determination of Composition of Particle Type by Morphology of Nanoparticles in Diesel Exhaust and Roadside Atmosphere
    2012
  • Development of source apportionment of individual particle by high resolution time of flight-secondary ion mass spectrometry
    Norihito Mayama; Eita Goto; Yusuke Miura; Kenji Ohishi; Tetsuo Sakamoto; Akinori Takami; Shiro Hatakeyama; Hiroshi Bandow; Kentaro Murano; Masaaki Fujii
    Journal of the Vacuum Society of Japan, 2012
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle (2G4)
    Yuji Fujitani; Tetsuo Sakamoto and Kentaro Misawa
    30th AAAR Annual Conference, 04 Oct. 2011
  • レーザーイオン化法によるディーゼル微粒子中の多環芳香族炭化水素の分析―適切なレーザー波長の選定
    三澤健太郎; 坂本哲夫; 藤谷雄二
    日本分析化学会年会講演要旨集, 31 Aug. 2011
  • ディーゼル起源ナノ粒子内部混合状態の新しい計測法
    藤谷雄二; 坂本哲夫; 三澤健太郎
    大気環境学会年会講演要旨集, 30 Aug. 2011
  • ディーゼルナノ粒子の内部混合状態計測への挑戦
    藤谷雄二; 坂本哲夫; 三澤健太郎
    エアロゾル科学・技術研究討論会, 27 Aug. 2011
  • ディーゼル起源ナノ粒子内部混合状態の新しい計測法
    藤谷雄二; 坂本哲夫; 三澤健太郎
    エアロゾル科学・技術研究討論会, 27 Aug. 2011
  • エレクトロスプレー法を用いた有機薄膜の製膜方法の研究
    Jul. 2011
  • Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS
    Takahiro Kashiwagi; J. Nakagawa; T. Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-13), 23 Jun. 2011
  • Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS
    2011
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle (2G4)
    2011
  • Organic Thin-Film Fabrication by Means of Electrospray Deposition
    Yuuki Watanabe; Saijou Kazuyuki and Tetsuo Sakamoto
    The 9th International Symposium on Advanced Technology (ISAT9), 05 Nov. 2010
  • Optimization of Charge-compensation in TOF-SIMS Analysis Using Low-energy Pulsed Electron Beam
    Kenji Ohishi and Tetsuo Sakamoto
    The 9th International Symposium on Advanced Technology (ISAT9), 05 Nov. 2010
  • Nondestructive Analytical Area Navigation in TOF-SIMS Using Integrated-SEM
    Kohei Fujioka and Tetsuo Sakamoto
    The 9th International Symposium on Advanced Technology (ISAT9), 05 Nov. 2010
  • レーザーイオン化／収束イオンビームによる単一ナノ粒子の履歴解析装置
    Oct. 2010
  • Chemical state of boron in coal fly ash investigated by focused-ion-beam time-of-flight secondary ion mass spectrometry (FIB-TOF-SIMS) and satellite-transition magic angle spinning nuclear magnetic resonance (STMAS NMR)
    Shun-ichi Hayashi; Takafumi Takahashi; Koji Kanehashi; Naoyoshi Kubota; Kaoru Mizuno; Shunsuke Kashiwakura; Tetsuo Sakamoto; Tetsuya Nagasaka
    CHEMOSPHERE, Aug. 2010
  • Detection of polymers using Laser SNMS
    Tetsuo Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12), 10 Jun. 2010
  • Image Analysis of Small Particles with a Combination of SEM and TOF-SIMS
    Hitoshi Wada; Kenji Ooishi and Tetsuo Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12), 10 Jun. 2010
  • Nondestructive Analytical Area Navigation in TOF-SIMS,using integrated SEM
    Kohei Fujioka and Tetsuo Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University (SISS-12), 10 Jun. 2010
  • Detection of polymers using Laser SNMS
    2010
  • Image Analysis of Small Particles with a Combination of SEM and TOF-SIMS
    2010
  • Nondestructive Analytical Area Navigation in TOF-SIMS using integrated SEM
    2010
  • Organic Thin-Film Fabrication by Means of Electrospray Deposition
    2010
  • Optimization of Charge-compensation in TOF-SIMS Analysis Using Low-energy Pulsed Electron Beam
    2010
  • Nondestructive Analytical Area Navigation in TOF-SIMS Using Integrated-SEM
    2010
  • Organic Thin-Film Fabrication by Means of Electrospray Deposition
    Itaru YAMAGUCHI; Yuuki WATANABE; Masayuki KOBAYASI; Toyokazu FURUYAMA; and Tetsuo SAKAMOTO
    The 1st Joint Symposium between Kogakuin University and Institute of Chemistry, Chinese Academy of Sciences (KU-ICCAS; JS1-2009), 09 Oct. 2009
  • FIB‐TOF‐SIMS/SNMSによる石炭灰単一微粒子内元素分布の観察
    林俊一; 久保田直義; 石月秀貴; 平等拓範; 石垣直也; 東條公資; 井戸豊; 坂本哲夫; 藤井正明
    日本分析化学会年会講演要旨集, 10 Sep. 2009
  • Boron detection in suspended particulate matter by means of FIB-EB-TOF-SIMS
    S.Hayashi; N.Kubota; K.Mizuno; S.Kashiwakura; T.Nagasaka and T.Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-11), 12 Jun. 2009
  • Image Analysis of Suspended Particulate Matters for Individual Particle Analysis using TOF-SIMS
    Hitoshi Wada; Yuuki Kanamori; Kenji Ooishi and Tetsuo Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-11), 11 Jun. 2009
  • Optimization of Charge-Compensation in TOF-SIMS Analysis using Low-Energy Pulsed Electron Beam
    Kenji Ohishi; Hirotaka Sekiyama and Tetsuo Sakamoto
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-11), 11 Jun. 2009
  • Development of Non-Resonant Multi Photonionization SNMS with Nd:YAG Microchip Laser
    2009
  • Local charge neutralization using secondary electrons induced by focused electron beam in TOF-SIMS analysis
    Tetsuo Sakamoto; Jyun Yamaguchi
    APPLIED SURFACE SCIENCE, Dec. 2008
  • A portable aerosol sampler for individual particle analysis by means of TOF-SIMS
    Jun Yamaguchi; Tetsuo Sakamoto
    APPLIED SURFACE SCIENCE, Dec. 2008
  • Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis
    Tetsuo Sakamoto; Masaomi Koizumi; Jyunji Kawasaki; Jyun Yamaguchi
    APPLIED SURFACE SCIENCE, Dec. 2008
  • Instrumental factors in resonance enhanced multi-photon ionization of FIB-sputtered atoms
    Tetsuo Sakamoto; Jyunji Kawasaki; Masaomi Koizumi
    APPLIED SURFACE SCIENCE, Dec. 2008
  • Organic Thin-Film Fabrication by means of Electrospray Deposition
    Itaru YAMAGUCHI; Yuuki WATANABE and Tetsuo SAKAMOTO
    4th Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA-4), 29 Oct. 2008
  • Development of the High-Spatial Resolution FIB-TOF-SIMS/REMPI Apparatus for Environmental Micro- and Nano-Particle Analysis
    Tetsuo Sakamoto; Jyunji Kawasaki and Kenji Ooishi
    The 10th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interations (SISS-10), 17 Jul. 2008
  • Selective Detection of Aromatic Compounds from Organic Mixtures by means of FIB-REMPI
    Tetsuo Sakamoto; Jyunji Kawasaki and Kenji Ooishi
    The 10th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interations (SISS-10), 17 Jul. 2008
  • 超臨界流体を用いた低環境負荷型のデバイスプロセス
    Jul. 2008
  • Selective Detection of Aromatic Compounds from Organic Mixtures by means of FIB-REMPI
    2008
  • Boron detection in suspended particulate matter by means of FIB-EB-ToF-SIMS
    2008
  • Fabrication of Organic Thin Films and Particles using Supercritical Fluids
    2008
  • Organic Thin-Film Fabrication by means of Electrospray Deposition
    2008
  • Development of the High-Spatial Resolution FIB-TOF-SIMS/REMPI Apparatus for Environmental Micro- and Nano-Particle Analysis
    Tetsuo Sakamoto; yunji Kawasaki; Kenji Ooishi
    The 10th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interations (SISS-10), 2008
  • Development of the FIB-REMPI Apparatus for Environmental Micro- and Nano-Particle Analysis (invited)
    Tetsuo Sakamoto
    6th International Symposium on Atomic Level Characterizations for New Materials and Devices '07, 02 Nov. 2007
  • 超臨界流体を用いた低環境負荷型のデバイスプロセス
    Jul. 2007
  • A Portable Aerosol Sampler for Individual Particle Analysis by means of TOF-SIMS
    2007
  • Instrumental Factors in Resonance Enhanced Multi-Photon Ionization of FIB-Sputtered Atoms
    2007
  • Development of a High Lateral Resolution TOF-SIMS Apparatus for Single Particle Analysis
    2007
  • Local Charge Neutralization using Secondary Electrons induced by Focused Electron Beam in TOF-SIMS Analysis
    2007
  • Resonance Enhanced Multi-Photon Ionization of Neutral Atoms sputtered with Ga-FIB
    2007
  • Development of the FIB-REMPI Apparatus for Environmental Micro- and Nano-Particle Analysis (invited)
    2007
  • Handling of the ice protective film for potential use in the 3D microscale analysis of biological samples
    T. Iwanami; YuJing Liu; M. Okazaki; M. Nojima; T. Sakamoto; M. Owari
    SURFACE AND INTERFACE ANALYSIS, Dec. 2006
  • Shave-off depth profiling for nano-devices
    Masashi Nojima; Masayuki Toi; Ayaka Maekawa; Takeshi Yamamoto; Tetsuo Sakamoto; Masanori Owari; Yoshimasa Nihei
    MICROCHIMICA ACTA, Sep. 2006
  • Study on Sampling Method of Suspended Particulate Matters for TOF-SIMS Analysis
    Boongang Kim; Masaomi Koizumi and Tetsuo Sakamoto
    The 9th International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions, the 141st committee, Japan Society for the Promotion of Science, 20 Jul. 2006
  • Study on an appropriate sampling method for individual particle analysis of SPM using TOF-SIMS
    Boongang Kim; Masaomi Koizumi and Tetsuo Sakamoto
    Proceedings of The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS9), 20 Jul. 2006
  • Shave-off depth profiling: Depth profiling with an absolute depth scale
    M. Nojima; A. Maekawa; T. Yamamoto; B. Tomiyasu; T. Sakamoto; M. Owari; Y. Nihei
    APPLIED SURFACE SCIENCE, Jul. 2006
  • A novel sample pretreatment method using supercritical fluids for the analysis of atmospheric environmental samples by means of time-of-flight secondary ion mass spectrometry
    T Sakamoto; A Yamamoto; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, Apr. 2006
  • Clean-up of n-alkanes by means of supercritical CO2 extraction for TOF-SIMS sample preparation
    T. Sakamoto; A. Yamamoto; Y. Nihei; M. Owari
    Proceedings of 5th International Symposium on Atomic Level Characterizations for New Materials and Devices `05, Apr. 2006
  • Handling of the ice protective film for potential use in the 3D microscale analysis of biological samples
    T. Iwanami; YuJing Liu; M. Okazaki; M. Nojima; T. Sakamoto; M. Owari
    Proceedings of 5th International Symposium on Atomic Level Characterizations for New Materials and Devices `05, 2006
  • Clean-up of n-alkanes by means of supercritical CO2 extraction for TOF-SIMS sample preparation
    2006
  • Study on Sampling Method of Suspended Particulate Matters for TOF-SIMS Analysis
    2006
  • Study on an appropriate sampling method for individual particle analysis of SPM using TOF-SIMS
    2006
  • Development of 3D nano analysis using shave-off depth profiling by FIB-SIMS
    A. Maekawa; T. Yamamoto; Y. Ishizaki; R. Tanaka; T. Sakamoto; M. Owari; M. Nojima and Y. Nihei
    5th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC'05), 06 Dec. 2005
  • Shave-Off Depth Profiling by the Nano Beam,SIMS
    M Nojima; A Maekawa; T Yamamoto; B Tomiyasu; T Sakamoto; M Owari; Y Nihei
    15th International Conferencec on Secondary Ion Mass Spectrometry (SIMS XV), 16 Sep. 2005
  • A Novel Pretreatment Technique of Environmental Samples using Supercritical Fluids for TOF-SIMS Analysis (Invited)
    T.Sakamoto; M.Owari and Y.Nihei
    International Symposium on SIMS and Related New Technology Based on Ion-Solid Interaction, 21 Jul. 2005
  • Cl2-assisted focused ion beam etching of Al for three dimensional microanalysis
    T. Iwanami; M. Karashima; T. Sakamoto and M. Owari
    Journal of Surface Analysis, Jul. 2005, [Reviewed]
  • Shave-off Depth Profiling for Nano-Devices
    M.Nojima; M.Toi; A.Maekawa; T.Yamamoto; T.Sakamoto; M.Owari and Y.Nihei
    International Union of Micro Analysis Society, IUMAS-3, 24 May 2005
  • The Shave-off Depth Profiling by the Nano-Beam SIMS
    Journal of surface analysis, 2005
  • Shave-off Depth Profiling for Nano-Devices
    2005
  • A Novel Pretreatment Technique of Environmental Samples using Supercritical Fluids for TOF-SIMS Analysis (Invited)
    2005
  • Study of 3D Micro-Scale Analysis of Freeze-Non-Dried Biotissue
    Journal of surface analysis, 2005
  • The Shave-off Depth Profiling by the Nano-Beam SIMS
    Journal of surface analysis, 2005
  • A novel sample pre-treatment method using supercritical fluids for the analysis of atmospheric environmental samples by means of time-of-flight secondary ion mass spectrometry
    2005
  • Development of 3D nano analysis using shave-off depth profiling by FIB-SIMS
    2005
  • The shave-off depth profiling by the nano-beam SIMS
    M. Toi; A. Maekawa; T. Yamamoto; B. Tomiyasu; T. Sakamoto; M. Owari; M. Nojima; Y. Nihei
    Journal of Surface Analysis, 2005
  • Cl2-assisted focused ion beam etching of Al for three dimensional microanalysis
    T. Iwanami; M. Karashima; T. Sakamoto; M. Owari
    Journal of Surface Analysis, 2005
  • Study of 3D Micro-Scale Analysis of Freeze-Non-Dried Biotissue
    Y. Liu; M. Nojima; T. Sakamoto; M. Owari
    Journal of Surface Analysis, 2005
  • Study of 3D Micro-Scale Analysis of Freeze-Non-Dried Biotissue
    Y. Liu; M. Nojima; T. Sakamoto and M. Owari
    3rd International Symposium on Practical Surface Analysis, PSA-04, 05 Oct. 2004
  • Cl2-assisted focused ion beam etching of Al for three dimensional microanalysis
    T. Iwanami; M. Karashima; T. Sakamoto and M. Owari
    3rd International Symposium on Practical Surface Analysis, PSA-04, 05 Oct. 2004
  • Supercritical fluid clean-up of environmental samples for the analysis of polycyclic aromatic hydrocarbons using time-of-flight secondary ion mass spectrometry
    T Sakamoto; A Yamamoto; M Owari; Y Nihei
    ANALYTICAL SCIENCES, Oct. 2004
  • 超臨界流体抽出法における環境汚染有機化合物の抽出特性の解析
    山本 あずさ、永井 一聡、坂本 哲夫、尾張 真則、二瓶 好正
    分析化学, Aug. 2004, [Reviewed]
  • Evaluation of the nano-beam SIMS apparatus
    M Nojima; M Toi; A Maekawa; B Tomiyasu; T Sakamoto; M Owari; Y Nihei
    APPLIED SURFACE SCIENCE, Jun. 2004
  • Structural Analysis of Fly Ash Particles by means of Dual Focused Beam Time-of-Flight Secondary Ion Mass Spectrometry
    T. Sakamoto; K. Shibata; K. Takanashi; M. Owari and Y. Nihei
    e-Journal of Surface Science and Nanotechnology, Feb. 2004, [Reviewed]
  • Nano-dimensional analysis for practical materials using nano-beam SIMS apparatus
    M. Nojima; M. Toi; A. Maekawa; B. Tomiyasu; T. Sakamoto; M. Owari and Y. Nihei
    e-Journal of Surface Science and Nanotechnology, Feb. 2004, [Reviewed]
  • Structural Analysis of Fly Ash Particles by means of Dual Focused Beam Time-of-Flight Secondary Ion Mass Spectrometry
    2004
  • Nano-dimensional analysis for practical materials using nano-beam SIMS apparatus
    2004
  • Development of a Separable-Type of Micro-Scale Glassware Optimized for Micro-Scale Chemical Experiments in University Laboratories
    KIM Boongang; TOJO Yosuke; SAKAMOTO Tetsuo; OWARI Masanori
    CHEMISTRY & EDUCATION, 2004
  • Cl2-assisted focused ion beam etching of Al for three dimensional microanalysis
    2004
  • Study of 3D Micro-Scale Analysis of Freeze-Non-Dried Biotissue
    2004
  • The shave-off depth profiling by the nano-beam SIMS
    2004
  • 短期連載 研究室における危険物と試薬の管理２ “試薬管理方法の実際”
    Nov. 2003
  • Speedy measurement method of toxic organic matters in environment using supercritical fluid carbon dioxide extraction
    A. Yamamoto; S. Miyazaawa; T. Sakamoto; M. Owari and Y. Nihei
    Proceedings of the 3rd Seoul National University and The University of Tokyo Joint Symposium, 31 Oct. 2003
  • Study on the system of methods for micro-scale chemical experiments to lose less chemical substances and minimize waste
    Boongan Kin; Yosuke Tojo; Jue Niu; Tetsuo Sakamoto and Masanori Owari
    Proceedings of The 3rd Seoul National University - University of Tokyo Joint Workshop on Environmental Science & Engineering, 31 Oct. 2003
  • Nano-dimensional analysis for practical materials using nano-beam SIMS apparatus
    M.Nojima; M.Toi; A.Maekawa; B.Tomiyasu; T.Sakamoto; M.Owari and Y. Nihei
    4th International Symposium on Atomic Level Characterizations for New Materials and Devices ALC'03, 07 Oct. 2003
  • Structural Analysis of Coal Fly Ash Particles by means of Focused-Ion-Beam Time-of-Flight Mass Spectrometry
    T. Sakamoto; K. Shibata; K. Takanashi; M. Owari and Y. Nihei
    4th International Symposium on Atomic Level Characterizations for New Materials and Devices ALC'03, 06 Oct. 2003
  • Evaluation of the nano-beam SIMS apparatus
    M .Nojima; M. Toi; A. Maekawa; B. Tomiyasu; T. Sakamoto; M .owari; Y. Nihei
    14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV), California, USA, 19 Sep. 2003, [Reviewed]
  • Development of a supercritical fluid extractor coupled with a time-of-flight mass spectrometer for online detection of extracts
    T Sakamoto; A Yamamoto; M Owari; Y Nihei
    ANALYTICAL SCIENCES, Jun. 2003
  • Analysis of non-woven fabric fibre using an ion and electron multibeam microanalyser
    K Takanashi; K Shibata; T Sakamoto; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, May 2003
  • Development and estimation of a nano-beam secondary ion mass spectrometry apparatus
    NOJIMA Masashi; KANDA Yusuke; TOI Masayuki; TOMIYASU Bunbunoshin; SAKAMOTO Tetsuo; OWARI Masanori; NIHEI Yoshimasa
    BUNSEKI KAGAKU, 05 Mar. 2003
  • Analysis of surface composition and internal structure of fly ash particles using an ion and electron multibeam microanalyzer
    T. Sakamoto; K. Shibata; K. Takanashi; M. Owari; Y. Nihei
    Applied Surface Science, 15 Jan. 2003
  • Evaluation of the nano-beam SIMS apparatus
    2003
  • Structural Analysis of Coal Fly Ash Particles by means of Focused-Ion-Beam Time-of-Flight Mass Spectrometry
    2003
  • Nano-dimensional analysis for practical materials using nano-beam SIMS apparatus
    2003
  • Speedy measurement method of toxic organic matters in environment using supercritical fluid carbon dioxide extraction
    2003
  • Study on the system of methods for micro-scale chemical experiments to lose less chemical substances and minimize waste
    2003
  • Analysis of surface composition and internal structure of fly ash particles using an ion and electron multibeam microanalyzer
    T Sakamoto; K Shibata; K Takanashi; M Owari; Y Nihei
    APPLIED SURFACE SCIENCE, Jan. 2003
  • Elemental distribution analysis of positive electrode material for a nickel metal hydride battery
    K Takanashi; M Yoshida; T Sakamoto; N Ono; Y Tanaka; M Owari; Y Nihei
    APPLIED SURFACE SCIENCE, Jan. 2003
  • Development of a chemically assisted micro-beam etching system for three-dimensional microanalysis
    Y Tanaka; M Karashima; K Takanashi; T Sakamoto; M Owari; Y Nihei
    APPLIED SURFACE SCIENCE, Jan. 2003
  • Development of Micro Chemical Reactor for Fine Organic Chemistry
    Mitsuhiro Matsubara; Boongang Kim; Tetsuo Sakamoto and Masanori Owari
    Proceedings of The 2nd UT-SNU Joint Workshop on Environmental Science and Engineering, 16 Dec. 2002
  • Development of Micro Chemical Laboratory System for Minimizing Laboratory Waste
    Boongang Kim; Yosuke Tojo; Jue Niu; Mitsuhiro Matsubara; Tetsuo Sakamoto; Masanori Owari
    The 5th Asian Symposium on Academic Activities for Waste Management (AAAWM), Kuala Lumpur, Malaysia, Sep. 2002
  • On-Campus Management of Hazardous Materials: A Practice of Pollutant Release and Transfer Register
    Kensuke Fukushi; Hidekuni Inadera; Tetsuo Sakamoto; Yoshimitsu Suzuki; and Kazuo Yamamoto
    The 5th Asian Symposium on Academic Activities for Waste Management (AAAWM), Kuala Lumpur, Malaysia, Sep. 2002
  • ToF-SIMS mapping of dialkylphthalate and bisphenol-A adsorbed on small particles
    N Ono; T Sakamoto; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, Aug. 2002
  • On-Campus Management of Hazardous Materials: A Practice of Pollutant Release and Transfer Register
    2002
  • Development of Micro Chemical Laboratory System for Minimizing Laboratory Waste
    2002
  • Development of Micro Chemical Reactor for Fine Organic Chemistry
    2002
  • Three-Dimensional Microanalysis of Solids by Means of Ion and Electron Dual Focused Beam Apparatus
    SAKAMOTO Tetsuo
    Bulletin of the Japan Institute of Metals, 2002
  • Exciton dynamics of orthorhombic phase PbI2 embedded in PbI2-PbBr2 mixed crystals
    J Takeda; T Sakamoto; T Arai; S Kurita
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, Dec. 2001
  • Elemental Distribution Analysis of Positive Electrode Material for a Nickel Metal Hydride Battery
    K. Takanashi; M Yoshida; T. Sakamoto; N. Ono; Y. Tanaka; M. Owari; Y. Nihei
    13th International Conference on Secondary Ion Mass Spectrometry SIMS XIII, Nov. 2001, [Reviewed]
  • Development of the Chemically Assisted Microbeam Etching System for Three Dimensional Microanalysis
    Y. Tanaka; M. Karashima; K. Takanashi; T. Sakamoto; M. Owari; Y. Nihei
    13th International Conference on Secondary Ion Mass Spectrometry SIMS XIII, Nov. 2001, [Reviewed]
  • Analysis of Surface Composition and Internal Structure of Flyash Particles Using an Ion and Electron Multibeam Microanlyzer
    Tetsuo Sakamoto; Kazuaki Shibata; Kazunari Takanashi; Masanori Owari; Yoshimasa Nihei
    13th International Conference on Secondary Ion Mass Spectrometry SIMS XIII, Nov. 2001
  • TOF-SIMS mapping of dialkyl phthalate and bisphenol-A adsorbed on small particles
    N. Ono; M. Owari; T. Sakamoto; Y. Nihei
    Book of Abstract 9th European Conference on Applications of Surface and Interface Analysis ECASIA ’01, Avignon, France, Oct. 2001
  • TOF-SIMS mapping of dialkyl phthalate and bisphenol-A adsorbed on small particles
    2001
  • Elemental Distribution Analysis of Positive Electrode Material for a Nickel Metal Hydride Battery
    2001
  • Analysis of Surface Composition and Internal Structure of Flyash Particles Using an Ion and Electron Multibeam Microanlyzer
    2001
  • Development of the Chemically Assisted Microbeam Etching System for Three Dimensional Microanalysis
    2001
  • A Novel Apparatus for Three-Dimensional Microanalysis using Ion and Electron Dual Focused Beams
    T. Sakamoto; K. Takanashi; Zh. H. Cheng; N. Ono; H. Wu; M. Owari and Y. Nihei
    Inst. Phys. Conf. Ser. No.165, Institute of Physics Publishing, Dec. 2000, [Reviewed]
  • Three-Dimensional Chemical Species Analysis Using a Ga FIB for Micro-Cross-Sectioning and TOF-SIMS Mapping
    T. Sakamoto; Y. Kuramoto; Zh. H. Cheng; K. Takanashi; H. Wu; M. Owari and Y. Nihei
    Secondary Ion Mass Spectrometry SIMS XII, Dec. 2000, [Reviewed]
  • Three-Dimensional Microanalysis of the Wire-Pad Contact Region of Integrated Circuit
    K. Takanashi; H. Wu; N. Ono; Zh. H. Cheng; T. Sakamoto; M. Owari and Y. Nihei
    Inst. Phys. Conf. Ser. No.165, Institute of Physics Publishing, Dec. 2000
  • Exciton dynamics of orthorhombic phase PbI2 embedded in PbI2-PbBr2 Mixed Crystals
    J. Takeda; T. Sakamoto; T. Arai and S. Kurita
    International Conference on Excitonic Processes in Condensed Matter, 22 Aug. 2000
  • Three-dimensional microanalysis of the wire-pad contact region of integrated circuits
    H Wu; K Takanashi; N Ono; ZH Cheng; T Sakamoto; T Sakou; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, Aug. 2000
  • Three-dimensional microanalysis of the wire-pad contact region of integrated circuits
    H. Wu; K. Takanashi; N. Ono; Zh H. Cheng; T. Sakamoto; T. Sakou; M. Owari; Y. Nihei
    Surface and Interface Analysis, Aug. 2000
  • An ion and electron multibeam system for three-dimensional microanalysis
    K Takanashi; H Wu; Y Kuramoto; ZH Cheng; T Sakamoto; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, Aug. 2000
  • Three-dimensional microanalysis of the wire-pad contact region of integrated circuits
    H Wu; K Takanashi; N Ono; ZH Cheng; T Sakamoto; T Sakou; M Owari; Y Nihei
    SURFACE AND INTERFACE ANALYSIS, Aug. 2000
  • デュアルビームを用いた三次元微小領域分析
    Jan. 2000
  • Exciton dynamics of orthorhombic phase PbI2 embedded in PbI2-PbBr2 Mixed Crystals
    2000
  • Three-dimensional microanalysis of the wire-pad contact region of integrated circuit
    K Takanashi; H Wu; N Ono; ZH Cheng; T Sakamoto; M Owari; Y Nihei
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000
  • Three-Dimensional Chemical Species Analysis Using a Ga FIB for Micro-Cross-Sectioning and TOF-SIMS Mapping
    2000
  • Three-dimensional microanalysis of the wire-pad contact region of integrated circuit
    K Takanashi; H Wu; N Ono; ZH Cheng; T Sakamoto; M Owari; Y Nihei
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000
  • A novell apparatus for three-dimensional microanalysis using ion and electron dual focused beams
    T Sakamoto; K Takanashi; ZH Cheng; N Ono; H Wu; M Owari; Y Nihei
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000
  • An Ion and Electron Multibeam System for Three-Dimensional Microanalysis
    K. Takanashi; H. Wu; Y. Kuramoto; Zh. H. Cheng; T. Sakamoto; M. Owari and Y. Nihei
    8th European Conference on Applications of Surface and Interface Analysis ECASIA’99, Oct. 1999
  • Auger Electron Emission from Metals under Gallium Focused Ion Beam Bombardment
    1999
  • Three-Dimensional Microanalysis of Solid Materials using Ion and Electron Dual Focused Beam Apparatus
    1999
  • Compositions of Cross-Sections Created with a Gallium Focused Ion Beam
    1999
  • Microarea Analysis using Auger Electrons induced by Gallium Focused Ion Beam
    1999
  • An Ion and Electron Multibeam System for Three-Dimensional Microanalysis
    1999
  • Microarea Analysis using Auger Electrons induced by Gallium Focused Ion Beam
    Zh. H. Cheng; T. Sakamoto; Y. Kuramoto; K. Takanashi; M. Owari and Y. Nihei
    Journal of Surface Analysis, Jan. 1999, [Reviewed]
  • Auger Electron Emission from Metals under Gallium Focused Ion Beam Bombardment
    Zh. H. Cheng; T. Sakamoto; Y. Kuramoto; K. Takanashi; M. Owari and Y. Nihei
    Journal of Surface Analysis, Jan. 1999, [Reviewed]
  • Compositions of Cross-Sections Created with a Gallium Focused Ion Beam
    M. Owari; T. Sakamoto; Zh. H. Cheng; Y. Kuramoto; K. Takanashi and Y. Nihei
    Journal of Surface Analysis, Jan. 1999, [Reviewed]
  • Three-Dimensional Microanalysis of Solid Materials using Ion and Electron Dual Focused Beam Apparatus
    T. Sakamoto; Zh. H. Cheng; Y. Kuramoto; K. Takanashi; M. Owari and Y. Nihei
    Journal of Surface Analysis, Jan. 1999, [Reviewed]
  • Three-Dimensional Microanalysis of Solid Materials using Ion and Electron Dual Focused Beam Apparatus
    T.Sakamoto; Zh.H.Cheng; M.Takahashi; Y.Kuramoto; M.Owari and Y.Nihei
    Abstracts of International Symposium on Practical Surface Analysis PSA-98, 20 Oct. 1998
  • Auger Electron Emission from Metals under Gallium Focused Ion Beam Bombardment
    Zh.H.Cheng; T.Sakamoto; M.Takahashi; Y.Kuramoto; M.Owari and Y.Nihei
    Abstracts of International Symposium on Practical Surface Analysis PSA-98, 20 Oct. 1998
  • Microarea Analysis using Auger Electrons induced by Gallium Focused Ion Beam
    Zh.H.Cheng; T.Sakamoto; M.Takahashi; Y.Kuramoto; M.Owari and Y.Nihei
    Abstracts of International Symposium on Practical Surface Analysis PSA-98, 20 Oct. 1998
  • Compositions of Cross-Sections Created with a Gallium Focused Ion Beam
    M.Owari; T.Sakamoto; M.Takahashi; Zh.H.Cheng; Y.Kuramoto and Y.Nihei
    Abstracts of International Symposium on Practical Surface Analysis PSA-98, 20 Oct. 1998
  • Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
    T. Sakamoto; Z. Cheng; M. Takahashi; M. Owari and Y. Nihei
    Secondary Ion Mass Spectrometry SIMS XI, eds. G. Gillen, R. Lareau, J. Bennett and F. Stevie, John Wiley & Sons, Oct. 1998, [Reviewed]
  • Development of ion and electron dual focused beam apparatus for high spatial resolution three-dimensional microanalysis of solid materials
    Z Cheng; T Sakamoto; M Takahashi; Y Kuramoto; M Owari; Y Nihei
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, Jul. 1998
  • Development of three-dimensional microanalysis using ion and electron dual-focused beams
    Tetsuo Sakamoto; Zhaohui Cheng; Masanori Takahashi; Yasuyuki Kuramoto; Masanori Owari; Yoshimasa Nihei
    Bunseki Kagaku, Jun. 1998, [Reviewed]
  • Microarea elemental mapping using gallium focused ion beam-induced Auger electrons
    Zhaohui Cheng; Tetsuo Sakamoto; Masanori Takahashi; Yasuyuki Kuramoto; Masanori Owari; Yoshimasa Nihei
    Bunseki Kagaku, Jun. 1998, [Reviewed]
  • Development of an ion and electron dual focused beam apparatus for three-dimensional microanalysis
    T Sakamoto; ZH Cheng; M Takahashi; M Owari; Y Nihei
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, Apr. 1998
  • Two Dimensional Elemental Mapping with Auger Electrons Induced by Ga Focused Ion Beam
    Zh. H. Cheng; T. Sakamoto; M. Takahashi; Y. Kuramoto; M. Owari and Y. Nihei
    The Microbeam Analysis 141 Committee of JSPS, Proceeding of ALC'97, Mar. 1998
  • Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
    T. Sakamoto; Zh. H. Cheng; M. Takahashi; Y. Kuramoto; M. Owari and Y. Nihei
    The Microbeam Analysis 141 Committee of JSPS, Proceeding of ALC'97, Mar. 1998
  • Two Dimensional Elemental Mapping with Auger Electrons Induced by Ga Focused Ion Beam
    1998
  • Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
    1998
  • Auger Electron Emission from Metals under Gallium Focused Ion Beam Bombardment
    1998
  • Microarea Analysis using Auger Electrons induced by Gallium Focused Ion Beam
    1998
  • Three-Dimensional Microanalysis of Solid Materials using Ion and Electron Dual Focused Beam Apparatus
    1998
  • Compositions of Cross-Sections Created with a Gallium Focused Ion Beam
    1998
  • Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
    1998
  • Individual Particle Analysis of Suspended Particulate Matter by Ga+ Focused Ion Beam SIMS and Electron Probe Microanalysis
    T. Sakamoto; B. Tomiyasu; N. Jingu; M. Owari and Y. Nihei
    Secondary Ion Mass Spectrometry SIMS X, Nov. 1997, [Reviewed]
  • Development of ion and electron dual focused beam apparatus for high spatial resolution three-dimensional microanalysis of solid materials
    M. Owari; T. Sakamoto; Zh. H. Cheng; M. Takahashi; Y. Kuramoto and Y. Nihei
    1997 Japan USA Seminar on Formation of Ion Nanobeams and Applications to Materials Processing, Nov. 1997
  • Focused Ion Beam as a Depth Evolving Tool for Depth and 3D Analysis
    T.Sakamoto
    Workshop "Towards the Ultimate Depth Resolution" in ALC'97, Nov. 1997
  • Ion and Electron Dual Focused Beam Apparatus for Three-Dimensional Microanalysis
    M. Owari; T. Sakamoto; Zh. H. Cheng; M. Takahashi and Y. Nihei
    ECASIA 97, Ed. by I. Olefjord, L. Nyborg and D. Briggs, John Wiley & Sons, Chichester, Oct. 1997, [Reviewed]
  • Microanalysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)
    Y. Nihei; B. Tomiyasu; T. Sakamoto and M. Owari
    Journal of Trace and Microprobe Techniques, Apr. 1997, [Reviewed]
  • Behavior of gallium secondary ion intensity in gallium focused ion beam secondary ion mass spectrometry
    T Sakamoto; M Owari; Y Nihei
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, Mar. 1997
  • Microanalysis by focused ion beam secondary ion mass spectrometry (FIB-SIMS)
    Y Nihei; B Tomiyasu; T Sakamoto; M Owari
    JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 1997
  • Ion and electron dual focused beam apparatus for three-dimensional microanalysis
    M Owari; T Sakamoto; ZH Cheng; M Takahashi; Y Nihei
    ECASIA 97: 7TH EUROPEAN CONFERENCE ON APPLICATIONS OF SURFACE AND INTERFACE ANALYSIS, 1997
  • Individual Particle Analysis of Suspended Particulate Matter by Ga+ Focused Ion Beam SIMS and Electron Probe Microanalysis
    1997
  • Development of ion and electron dual focused beam apparatus for high spatial resolution three-dimensional microanalysis of solid materials
    1997
  • Focused Ion Beam as a Depth Evolving Tool for Depth and 3D Analysis
    1997
  • Simulation of Erosion of a Particle by Ion Bombardment
    T. Sakamoto; B. Tomiyasu; M. Owari and Y. Nihei
    Proceedings of ECASIA'95, Oct. 1996, [Reviewed]
  • Same particle analysis of suspended particulate matter by electron probe microanalysis and secondary ion mass spectrometry
    Tetsuo Sakamoto; Bunbunoshin Tomiyasu; Nobuyasu Jingu; Masanori Owari; Yoshimasa Nihei
    Bunseki Kagaku, Jun. 1996, [Reviewed]
  • Simulation of Erosion of a Particle by Ion Bombardment
    1996
  • Microanalysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)
    Y. Nihei; B. Tomiyasu; T. Sakamoto and M. Owari
    14th international congress on X-ray optics and microanalysis, Aug. 1995
  • Quantitative Analysis of Micro-Volume by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    Y. Nihei; B. Tomiyasu; T. Sakamoto and M. Owari
    Proceedings of The 2nd NIRIM International Symposium on Advanced Materials (ISAM '95), Mar. 1995
  • Quantitative Analysis of Micro-Volume by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    1995
  • Microanalysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB-SIMS)
    1995
  • Three Dimensional Analysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    Yoshimasa Nihei; Bunbunoshin Tomiyasu; Tetsuo Sakamoto and Masanori Owari
    1st Japan-China Joint Symposium on Microbeam Analysis, 01 Dec. 1994
  • Measurements and Model Calculation of Ambient Oxygen Effect on Secondary Ion Enhancement in Gallium Focused Ion Beam SIMS
    T.Sakamoto; B.Tomiyasu; N.Mie; M.Owari and Y.Nihei
    SIMS IX, John Wiley & Sons, 01 Nov. 1994, [Reviewed]
  • AMBIENT OXYGEN EFFECT IN GA(+) FIB-SIMS
    T SAKAMOTO; B TOMIYASU; M OWARI; Y NIHEI
    SURFACE AND INTERFACE ANALYSIS, Jul. 1994
  • Ambient Oxygen Effect in Ga+ FIB-SIMS
    T.Sakamoto; B.Tomiyasu; M.Owari and Y.Nihei
    Surface and Interface Analysis, Jun. 1994, [Reviewed]
  • Three Dimensional Analysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    Y. Nihei; B. Tomiyasu; T. Sakamoto and M. Owari
    Extended abstract of International Workshop on Ion Micro Beams, May 1994
  • Three Dimensional Analysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    1994
  • Measurements and Model Calculation of Ambient Oxygen Effect on Secondary Ion Enhancement in Gallium Focused Ion Beam SIMS
    1994
  • Three Dimensional Analysis by Focused Ion Beam Secondary Ion Mass Spectrometry (FIB SIMS)
    1994
  • Ambient oxygen effect in Ga+-FIB SIMS
    T. Sakamoto; B. Tomiyasu; M. Owari and Y. Nihei
    Abstracts of 5th European Conference on Applications of Surface and Interface Analysis (ECASIA93), Oct. 1993
  • Ambient oxygen effect in Ga+-FIB SIMS
    1993

Lectures, oral presentations, etc.

  • Analysis of Alterration of Yellow Sands through Chemical Reaction in Air using FIB-TOF-SIMS
    R. Nukui; S. Kuromatsu; T. Sakamoto
    The 24th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS24), 18 Jun. 2025
  • TOF-SIMS Analysis of Single Cell using the Rapid Freezing Mehtod
    J. Takikawa; R. Hayasaki; K. Nagase; M. Kakihana; T. Ohira; N. Ikeda; T. Sakamoto
    The 24th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS24), 18 Jun. 2025
  • 広島市で採取された熔融粒子のFIB-TOF-SIMS分析による分類 [HCG22-11]
    27 May 2025
  • 局所的な原子化に対する共鳴イオン化質量分析の最適化に関する基礎検討 [1H10]
    12 Mar. 2025
  • FIB-TOF-SIMS分析のためのフェムト秒パルスレーザーを用いた断面加工前処理法 [P01-22p-P-16]
    22 Jan. 2025
  • 性状変化した黄砂のFIB-TOF-SIMSによる個別粒子分析
    11 Dec. 2024
  • アトムプローブ分析における水素バックグラウンド抑制
    11 Dec. 2024
  • 広島市で採取された熔融粒子の断面分析による分類検討
    11 Dec. 2024
  • 単一細胞内の成分イメージングため急速凍結装置開発
    11 Dec. 2024
  • FIB-TOF-SIMS を用いたスフェロイド断面の薬剤分布分析
    11 Dec. 2024
  • FIB - TOF-SIMSによる微小試料の三次元分析法開発 による微小試料の三次元分析法開発
    11 Dec. 2024
  • FIB-TOF-SIMS を用いたスフェロイドの断面薬剤分布分析
    05 Nov. 2024
  • Introduction of Materials Analysis Group in Kogakuin University
    Tetsuo Sakamoto
    RIMS 2024 workshop, 25 Mar. 2024, [Invited]
  • 基本波・第二高調波切替型Ti:Sapphireレーザーを用いた共鳴イオン化質量分析における対象元素の迅速切り替えの実証
    24 Mar. 2024
  • Development of a Rapid Freezing Method for Single Cell Analysis usinig TOF-SIMS
    Tomoki Goto; Tsukasa Ishino; Reito Tabatake; Masato Morita; Kumiko Nagase; Masatoshi Kakihana; Tatsuo Ohira; Norihiko Ikeda and Tetsuo Sakamoto
    第7回KBMSS国際シンポジウム, 30 Jan. 2024
  • Development of a method for discriminating lung cancer by cluster analysis and elemental distribution using FIB-TOF-SIMS
    Aru Nakabayashi; Yuta Kamiya; Junichiro Takikawa; Mizuki Shu; Masato Morita; Kumiko Nagase; Masatoshi Kakihana; Tatsuo Ohira; Norihiko Ikeda and Tetsuo Sakamoto
    第7回KBMSS国際シンポジウム, 30 Jan. 2024
  • レーザー共鳴イオン化法を用いた微小の同位体比分析の高精度化
    26 Jan. 2024
  • 二次中性粒子の共鳴イオン化に基づく多元素・同位体分析法の開発 (P07)
    22 Jan. 2024
  • FIB-TOF-SIMS分析のためのフェムト秒レーザー断面加工(P16)
    06 Dec. 2023
  • FIB-TOF-SIMSによるシスプラチンの細胞内分布分析(P17)
    06 Dec. 2023
  • 広島市で採取された熔融粒子の断面分析による分類(P18)
    06 Dec. 2023
  • 広島市において採取された原爆由来と思われる微小熔融粒子の分析手法の開発(A08)
    04 Nov. 2023
  • FIB-TOF-SIMSによる個々のがん細胞の凍結分析法の開発
    28 Oct. 2023
  • FIB-TOF-SIMSを用いたアエンデ隕石マトリックスのAr-rich粒子の分類 (P-05)
    26 Oct. 2023
  • エアロゾルをSEM観察によって発生源別にカウントする方法の開発 (P-07)
    26 Oct. 2023
  • 共鳴ポンピング・トンネルイオン化SNMSによる,同位体比分析手法の開発(P-08)
    26 Oct. 2023
  • FIB-TOF-SIMSを用いた肺がんのクラスター解析による判別手法(P-12)
    26 Oct. 2023
  • Development of Multi-Scale Analysis by Operando Spectroscopy / Elemental Measurement in Oxide-type All-Solid-State Na Batteries (A04-0744)
    Koji Hiraoka; Kazuo Yamamoto; Takeshi Kobayashi; Tetsuo Sakamoto; Shiro Seki
    244th Electrochemical Society (ECS) meeting, 11 Oct. 2023, The electrochemical society
  • 共鳴イオン化二次中性粒子質量分析による多元素・同位,体分析のための波長可変レーザーシステムの開発(2) 共鳴イオン化への適用
    20 Sep. 2023
  • 世界初の同位体分析装置による少量燃料デブリの性状把握分析手法の確立 (1) 同位体マイクロイメージング装置の廃炉への応用：総論(2F01)
    07 Sep. 2023
  • 世界初の同位体分析装置による少量燃料デブリの性状把握分析手法の確立 (2)同位体マイクロイメージング装置の性能・仕様と実用化開発(2F02)
    07 Sep. 2023
  • 世界初の同位体分析装置による少量燃料デブリの性状把握分析手法の確立 (3) 多元素迅速分析のための基本波・倍波切り替え型Ti:Sapphireレーザーの開発(2F03)
    07 Sep. 2023
  • 世界初の同位体分析装置による少量燃料デブリの性状把握分析手法の確立 (4) 高感度・高精度同位体分析のための共鳴イオン化スキームの開発(2F04)
    07 Sep. 2023
  • 世界初の同位体分析装置による少量燃料デブリの性状把握分析手法の確立 (5)1F汚染試料の微小領域における同位体組成分析(2F05)
    07 Sep. 2023
  • 広島市において採取された原爆由来と思われる微小熔融粒子の分析
    07 Sep. 2023
  • 2色共鳴イオン化レーザーの稼働状態モニタリングシステムの開発(1F07)
    06 Sep. 2023
  • Multi-Scale Analysis for Oxide-type All-Solid-State Na Batteries by Operando Spectroscopy / Elemental Measurement
    K. Hiraoka; K. Yamamoto; T. Kobayashi; T. Sakamoto; S. Seki
    74PROGRAM th Annual Meeting of the International Society of Electrochemistry, 05 Sep. 2023, International Society of Electrochemisty
  • FIB-TOF-SIMSによる健康影響が示唆されている微粒子に対する分析(P25)
    30 Aug. 2023
  • 二次中性原子に対する共鳴イオン化スキーム探査のための基礎実験装置の開発
    17 Aug. 2023
  • FIB-TOF-SIMSによる微小粒子の表面および断面の分析
    10 Aug. 2023
  • 共鳴イオン化レーザーSNMS装置の開発と福島第一原発廃炉工程への応用(invited)
    30 Jun. 2023, [Invited]
  • Development of Dual-laser SNMS Technique and Investigation of Its Ionization Mechanism (O2-2, invited)
    R. Saito; M. Morita and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-22), 16 Jun. 2023, The Japan Society of Vacuum and Surface Science, [Invited]
  • 共鳴イオン化二次中性粒子質量分析による多元素・同位体分析のための 波長可変レーザーシステムの開発(16p-D519-12)
    16 Mar. 2023
  • SDGs視点から見た今後の先端計測技術のあるべき姿と可能性
    07 Mar. 2023
  • Development of a method for cryo-analysis of individual cancer cells using FIB-TOF-SIMS
    Tomoki Goto; Naoki Arai; Soushi Taniwaki; Masato Morita; Kumiko Nagase; Tatsuo Ohira; and Tetsuo Sakamoto
    International Symoposium on Mass Spectrometry Imnaging 2023 Kyoto, 30 Jan. 2023, Kyoto Biomolecular Mass Spectrometry Society
  • Component imaging inside spheroids using human liver cancer cells
    Mizuki Shu; Aru Nakabayashi; Tubasa Fukuzawa; Reiko Saito; Kazuya Matsuhima; Yoshihiko Watanabe; Nobuhiko Kojima; and Tetsuo Sakamoto
    International Symposium on Mass Spectrometry Imaging 2023 Kyoto, 30 Jan. 2023, Kyoto Biomolecular Mass Spectrometry Society
  • FIB-TOF-SIMSによるディーゼル排気微粒子の内部構造分析
    14 Dec. 2022
  • FIB-TOF-SIMSを用いたがん細胞の個別分析によるバイオマーカー探索
    14 Dec. 2022
  • 福島第一原発の燃料デブリ分析に向けたR-SNMS法の検証
    14 Dec. 2022
  • アエンデ隕石マトリックスの断面観察
    14 Dec. 2022
  • 高分解能質量顕微鏡の開発と単一細胞分析・がんの悪性度評価への応用（特別講演）
    20 Nov. 2022, [Invited]
  • FIB-TOF-SIMSを用いた生体試料の凍結分析法の開発
    20 Nov. 2022
  • FIB-TOF-SIMSによる薬剤を投与したスフェロイド断面の成分イメージング
    20 Nov. 2022
  • SEM観察によるエアロゾル粒子の発生源別個数評価表法の検討
    17 Nov. 2022
  • 酸化物Na系全固体電池のオペランド分光 / 元素分布分析技術のマルチスケール化(1C09)
    08 Nov. 2022
  • 超微量元素を選択検出する多重反射レーザー共鳴イオン化分析（装置・デバイス 55）
    04 Oct. 2022
  • Investigation of post-ionization mechanism in dual-laser SNMS
    Reiko Saito; Masato Morita and Tetsuo Sakamoto
    14th International Symposium on Atomic Level Characterizations for New Materials and Devices '22 (ALC'22), 21 Oct. 2022, The Division of Microbeam Anlaysis, The Japan Society of Vacuum and Surface Science (JVSS)
  • Preparation of smooth cross sections of frozen biological specimens using FIB
    Tomoki Goto; Naoki Arai; Soushi Taniwaki; Yuta Yamashita; Reiko Saito; Kazuya Matsushima; Yoshihiko Watanabe; Nobuhiko Kojima; Masato Morita and Tetsuo Sakamoto
    14th International Symposium on Atomic Level Characterizations for New Materials and Devices '22 (ALC'22), 19 Oct. 2022, The Division of Microbeam Anlaysis, The Japan Society of Vacuum and Surface Science (JVSS)
  • Two color resonant laser SNMS for isotope micro imaging of nuclear fuel debris (invited)
    Tetsuo Sakamoto
    14th International Symposium on Atomic Level Characterizations for New Materials and Devices '22 (ALC'22), 18 Oct. 2022, The Division of Microbeam Anlaysis, The Japan Society of Vacuum and Surface Science (JVSS), [Invited]
  • Cross-sectional imaging of spheroids using high resolution FIB-TOF-SIMS
    Mizuki Shu; Aru Nakabayashi; Tsubasa Fukuzawa; Reiko Saito; Kazuya Matsushima; Yoshihiko Watanabe; Nobuhiko Kojima; Masato Morita and Tetsuo Sakamoto
    14th International Symposium on Atomic Level Characterizations for New Materials and Devices '22 (ALC'22), 18 Oct. 2022, The Division of Microbeam Anlaysis, The Japan Society of Vacuum and Surface Science (JVSS)
  • Development of Isotope Micro-Imaging Apparatus and Application for Debris of FDNPP (FDR2022-1079)
    Shoki Yoshimura; Tomoki Goto; Takumi Umedate; Masato Morita; Tesuo Sakamoto; Hideki Tomita; Hiroki Miura; Yoshihiro Iwata; Masabumi Miyabe; Ikuo Wakaida; Yoshihiro Sekio; Koji Maeda; Masato Mizokami
    International Topical Workshop on Fukushima Decommissioning Research 2022 (FDR2022), 16 Oct. 2022
  • Timing synchronization and position stabilization of laser pulses in resonance ionization mass spectrometry for multi-element/isotope analysis (FDR2022-1078)
    Hideki Tomita; Hiroki Miura; Volker Sonnenschein; Shoki Yoshimura; Takumi Umedate; Masato Morita; Tetsuo Sakamoto; Masabumi Miyabe; Ikuo Wakaida
    International Topical Workshop on Fukushima Decommissioning Research 2022 (FDR2022), 15 Oct. 2022
  • FIB-ToF-SIMSを用いた肺胞沈着DEPの成分分析(P-018#)
    14 Sep. 2022
  • FIB-TOF-SIMS による植物石への Cs 吸着の可視化(1P-24)
    24 Aug. 2022
  • レーザー共鳴イオン化－二次中性粒子質量分析による多元素の迅速同位体分析に向けた基礎検討(Poster22)
    18 Aug. 2022
  • レーザー共鳴イオン化2次中性粒子質量分析装置におけるイオン引き込み電極の設計検討
    17 Dec. 2021
  • Cluster analysis of aerosol in urban city air
    K. Sakai; S. Tsuchida; N. Kato; M. Morita; and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-21), 09 Dec. 2021
  • Study on the Pretreatment of water-containing biological samples and cross-sectional imaging of spheroids by FIB-TOF-SIMS
    M. Shu; T. Goto; H. Takeuchi; R. Saito; K. Matsushima; M. Saito; S. Hanada; N. Kojima; M. Morita; and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-21), 09 Dec. 2021
  • Validation of R-SNMS for fuel debris analysis
    T. Umedate; T. Yoshida; S.Yoshimura; M.Masato; Y.Sekio; K.Maeda; T.Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-21), 09 Dec. 2021
  • FIB-TOF-SIMSによる植物石のCs脱離プロセスの解明
    08 Dec. 2021
  • FIB-TOF-SIMS分析のための生体試料の平滑断面加工
    08 Dec. 2021
  • TOF-SIMSを用いた都市大気エアロゾルの個別形状及び成分分析
    08 Dec. 2021
  • 高分解能TOF-SIMS/SNMSによる大気環境および廃炉工程への貢献 (基調講演)
    29 Nov. 2021, [Invited]
  • Component imaging of spheroids by using an FIB-TOF-SIMS (BFSL8)
    Tomoki Goto; Hyogo Takeuchi; Mizuki Shu; Reiko Saito; Kazuya Matsushima; Makoto Saito; Sanshiro Hanada; Nobuhiko Kojima; Masato Morita; and Tetsuo Sakamoto
    The 20th International Symposium on Advanced Technology (ISAT-20), 23 Nov. 2021, Kogakuin University
  • Micro scale analysis of LFP cathode of all solid state battery by FIB TOF SIMS (EEEL11)
    Akihiro Kawasugi; Naoki Gomyo; Linchun He; Masato Morita; and Tetsuo Sakamoto
    The 20th International Symposium on Advanced Technology (ISAT-20), 23 Nov. 2021, Kogakuin University
  • Development of resonance ionization mass spectrometry imaging method for radioactive Sr isotopes analysis
    Takeru Yoshida; Takumi Umedate; Masato Morita; Tetsuo Sakamoto; Yue Zhao; Vollker Sonnenschein; Hideki Tomita; Toshihide Kawai; Takeo Okumura; Yukihiko Sato; Masabumi Miyabe and Ikuo Wakaida
    The 20th International Symposium on Advanced Technology (ISAT-20), 23 Nov. 2021, Kogakuin University
  • Analysis of aerosol in urban city air using FIB-TOF-SIMS
    Kentaro Sakai; Shokei Tsuchida; Noa Kato; Masato Morita; and Tetsuo Sakamoto
    The 20th International Symposium on Advanced Technology (ISAT-20), 23 Nov. 2021, Kogakuin University
  • Validation of Spray Droplets by ESD for a New Technique of Single Cell Rapid Freezing (EEEL16)
    Takayuki Umemura; Kenta Shirasu; Masato Morita; Kumiko Nagase; Wakako Hamanaka; Masatoshi Kakihana; Tatsuo Ohira; Norihiko Ikeda and Tetsuo Sakamoto
    The 20th International Symposium on Advanced Technology (ISAT-20), 23 Nov. 2021, Kogakuin University
  • Micro-scale analysis of LFP cathode of all-solid-state battery by FIB-TOF-SIMS
    Akihiro Kawasugi; Naoaki Gomyo; Linchun He; Msato Morita and Tetsuo Sakamoto
    13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21), 19 Oct. 2021, The Division of Microbeam Analysis, JVSS
  • Development of lung cancer tissue analysis method using FIB-TOF-SIMS
    Kenta Shirasu; Masato Morita; Kumiko Nagase; Wakako Hamanaka; Masatoshi Kakihana; Tatsuo Ohira; Norihiko Ikeda and Tetsuo Sakamoto
    13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21), 19 Oct. 2021, The Division of Microbeam Analysis, JVSS
  • Smooth cross-sectioning of frozen spheroids by using a focused ion beam
    Hyogo Takeuchi; Tomoki Goto; Mizuki Shu; Reiko Saito; Kazuya Matsushima; Makoto Saito; Sanshiro Hanada; Nobuhiko Kojima; Masato Morita and Tetsuo Sakamoto
    13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21), 19 Oct. 2021, The Division of Microbeam Analysis, JVSS
  • Development of Analysis Method of Fine Particles in Alveoluses by FIB-TOF-SIMS
    Shokei Tsuchida; Masato Morita and Tetsuo Sakamoto
    13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21), 19 Oct. 2021, The Division of Microbeam Analysis, JVSS
  • Development of a Screening Method for Radioactive Small Particles contained in a Large Number of Aerosol Particles prior to FIB-TOF-SIMS Analysis
    Syoki Yoshimura; Masato Morita; Yuya Ogura and Tesuo Sakamoto
    13th International Symposium on Atomic Level Characterizations for New Materials and Devices '21 (ALC'21), 19 Oct. 2021, The Division of Microbeam Analysis, JVSS
  • SEM画像を用いたエアロゾルの形状識別と分類(P-43#)
    15 Sep. 2021
  • 多色共鳴イオン化法を用いた超高精度・微小領域同位体イメージング
    25 Aug. 2021
  • FIB-TOF-SIMSによるLFPカソード分析(1G11)
    08 Sep. 2021
  • FIB-TOF-SIMSによるスフェロイドの成分イメージング(O01)
    01 Sep. 2021
  • 高分解能TOF-SIMSを用いた細胞成分イメージング(P06)
    01 Sep. 2021
  • 放射性Sr分析のためのレーザーSNMS分析法の,開発
    26 Aug. 2021
  • FIB-TOF-SIMSによるB同位体のマイクロイ,メージング
    26 Aug. 2021
  • 福島原発事故後10年間の空間線量率の測定と除染活動の推進、そして農業復興の状況
    07 Jul. 2021
  • フェムト秒レーザーを用いたSNMSの高感度化の検討
    25 Jun. 2021
  • TOF-SIMSによるディーゼルすす粒子の肺胞における健康影響分析
    25 Jun. 2021
  • SDGsをベースとした将来設計
    20 Apr. 2021
  • 共鳴イオン化質量分析のためのレーザーパルス時間・空間同期法の開発([2D09])
    18 Mar. 2021
  • 最新のレーザー技術を用いた「第２世代」レーザーSNMSの開発と展望（依頼講演）
    02 Mar. 2021, [Invited]
  • Compositional analysis of black carbon aerosols by means of TOF-SIMS and SNMS
    Kentaro Sakai; Ryota Koiwai; Masato Morita; Tetsuo Sakamoto
    ISAT19, 14 Jan. 2021
  • Development of Individual cell components analysis method for tissue sample with TOF-SIMS
    Kenta Shirasu; Kazuya Tamura; Masato; Morita; Kumiko Nagase; Wakako; Hamanaka; Masatoshi Kakihana; Tatsuo; Ohira; Norihiko Ikeda; Tetsuo Sakamoto
    ISAT19, 14 Jan. 2021
  • LAGP 固体電解質の劣化メカニズムの解明
    16 Dec. 2020
  • ディーゼルすす粒子の健康影響の解明
    16 Dec. 2020
  • 単一細胞噴霧における ESD 法と従来法の比較
    16 Dec. 2020
  • 共鳴イオン化SNMS法による固体局所の同位体⽐分析
    25 Nov. 2020
  • R-SNMS分析のための共鳴レーザースペクトル線幅の最適化
    24 Nov. 2020
  • TOF-SIMSによる単⼀細胞分析のための急速凍結法の開発
    24 Nov. 2020
  • FIB-TOF-SIMSを⽤いた固体電解質粒⼦の劣化メカニズムの解明
    24 Nov. 2020
  • High resolution TOF-SIMS analysis of creaked solid state electrolyte and revealing its degradation mechanism
    K. Watarai; M. Morita; L. He and T. Sakamoto
    SIMS研究会13, 25 Sep. 2020
  • 大気微粒子の新たな解析方法
    25 Sep. 2020
  • TOF-SIMSによる単一細胞分析のためのESD急速凍結法の開発
    25 Sep. 2020
  • TOF-SIMS及びSNMSによるブラックカーボン粒子の構造解析
    25 Sep. 2020
  • TOF-SIMSを用いた肺がん培養細胞のクラスター解析
    25 Sep. 2020
  • 共鳴イオン化SNMSによるウランの同位体比分析に関する研究
    25 Sep. 2020
  • Black carbonの高分解能TOF-SIMS分析
    25 Sep. 2020
  • 植物石によるセシウムの吸脱着機構の研究
    03 Sep. 2020
  • レーザー共鳴イオン化におけるウランのイオン化スキームの最適化
    03 Sep. 2020
  • レーザー共鳴イオン化を用いた迅速同位体分析法の開発 (3N01)(講演会中止）
    18 Mar. 2020
  • 共鳴イオン化を用いたスパッタ中性粒子質量分析法 I：多色共鳴イオン化 (16aK26-8)（講演会中止）
    16 Mar. 2020
  • 共鳴イオン化を用いたスパッタ中性粒子質量分析法 II：共鳴ポンピングトンネルイオン化 (16aK26-9)（講演会中止）
    16 Mar. 2020
  • TOF-SIMS を用いた蜘蛛の巣における粘着物質の分析（講演会中止）
    14 Mar. 2020
  • レーザー共鳴イオン化を用いたスパッタ中性粒子質量分析法による同位体分析への応用（講演会中止）
    14 Mar. 2020
  • 高空間分解能TOF-SIMSおよび共鳴イオン化SNMS装置の開発と環境微粒子、難分析核種、工業材料への応用（依頼講演）
    14 Jan. 2020
  • A rapid screening method of target particles for TOF-SIMS analysis
    Hiyori Hoshino; Takeru Yoshida; Yuzuka Ohmori; Yuta Miyashita; Yue Zhao; Masato Morita; Tetsuo Sakamoto; Toshihide Kawai; Takeo Okumura; Hideki Tomita; Yukihiko Satou; Masabumi Miyabe; Ikuo Wakaida
    Proceedings of the 38th Symposium on Materials Science and Engineering Research Center of Ion Beam Technology Hosei University, 2020
  • 多色共鳴レーザーイオン化を用いた放射性同位元素のマイクロイメージング（依頼講演）
    19 Dec. 2019
  • 植物石に吸収されたCs に関する研究
    19 Dec. 2019
  • 植物石のCs 吸収メカニズムの解明
    18 Dec. 2019
  • ナノサイズ試料の内部成分イメージングに向けたエレクトロスプレー透析法
    18 Dec. 2019
  • TOF-SIMS における分析対象粒子の高速スクリーニング
    18 Dec. 2019
  • TOF-SIMS を用いた大気微粒子の成分分析と分類
    18 Dec. 2019
  • TOF-SIMS 分析のための急速凍結とその評価
    18 Dec. 2019
  • 植物に吸収された Cs の微小領域イメージング
    11 Jul. 2019
  • 放射性物質のマイクロイメージング (P4-04)
    10 Jul. 2019
  • Development of High Spatial Resolution TOF-SIMS for Nano-Scale Mass Imaging of Industrial, Biological, Environmental Samples
    Tetsuo Sakamoto
    The 2nd Symposium for Collaborative Research on Energy Science and Technology, 05 Jul. 2019, Kogakuin University and National University of Singapore, [Invited]
  • TOF-SIMS Characterization of NASICON electrolyte
    Jin An Sam Oh; Masato Morita; Yue Zhao; Tetsuo Sakamoto and Li Lu
    The 2nd Symposium for Collaborative Research on Energy Science and Technology, 05 Jul. 2019, Kogakuin University and National University of Singapore
  • Analysis of water-containing biological sample by TOF-SIMS
    Kazuya Tamura; Takurou Hasegawa; Masato Morita and Tetsuo Sakamoto
    The 2nd Symposium for Collaborative Research on Energy Science and Technology, 05 Jul. 2019, Kogakuin University and National University of Singapore
  • Development of freeze-fracture system for wet samples and devices
    K. Watarai; M. Morita and T. Sakamoto
    The 2nd Symposium for Collaborative Research on Energy Science and Technology, 05 Jul. 2019, Kogakuin University and National University of Singapore
  • Development of Multi-isotope Analysis with Resonance Ionization Mass Spectrometry (FDR2019-1035)
    Kotaro Kato; Hideki Tomita; Volker Sonnenschein; Masaya Ohashi; Yoshiki Matsui; Toki Sakazaki; So Suzuki; Tetsuo Iguchi; Masato Morita; Tetsuo Sakamoto; Toshihide Kawai; Takeo Okumura; Ikuo Wakaida; Yukihiko Satou; Masabumi Miyabe
    International Topical Workshop on Fukushima Decommissioning Research (FDR2019), 25 May 2019, Atomic Energy Society of Japan
  • Development of micro imaging technique for radioactive fine particle by means of resonant laser ionization sputtered neutral mass spectrometry (FDR2019-1113)
    Masato Morita; Yue Zhao; Hideki Tomita; Volker Sonnenschein; Masaya Ohashi; Kotaro Kato; Yoshiki Matsui; Tetsuo Iguchi; Toshihide Kawai; Takeo Okumura; Ikuo Wakaida; Yukihiko Satou; Masabumi Miyabe; Tetsuo Sakamoto
    International Topical Workshop on Fukushima Decommissioning Research (FDR2019), 25 May 2019
  • Development of Multi-element/isotope Analysis,with Resonance Ionization Mass Spectrometry and Resonant Laser Secondary Neutral Mass,Spectrometry (Poster 36)
    TOMITA Hideki; SONNENSCHEIN; Volker; KATO Kotaro; SAITO Kosuke; OHASHI Masaya; SUZUKI Sou; MATSUI Yoshiki; SAKAZAKI Toki; IGUCHI Tetsuo; MORITA Masato; SAKAMOTO Tetsuo; KAWAI Toshihide; OKUMURA Takeo; SATOU Yukihiko; MIYABE Masabumi; WAKAIDA Ikuo; and WENDT Klaus
    Internatinal Conference Merger of the Poznan Meeting on Lasers and Trapping Devices in Atomic Nuclei Research and the International Conference on Laser Probing, 20 May 2019, Helmohlz Institute Mainz
  • バイオマーカーによる悪性度評価に向けた細胞内微細構造イメージング手法の開発
    08 May 2019
  • Laser-SNMSを用いたバナジウムの共鳴イオン化に関す,る研究
    10 Mar. 2019
  • TOF-SIMSによる蜘蛛の巣の粘球における構造モデルの決定
    21 Feb. 2019
  • レーザー共鳴イオン化による多核種迅速分析にむけた波長可変レーザーシステムの開発
    29 Jan. 2019
  • Applications of a High Resolution Mass Imaging Microscope (FIB-TOF-SIMS) (Lecture11)
    Masato Morita and Tetsuo Sakamoto
    The 1st Symposium for Collaborative Research on Energy Science and Technology, 10 Jan. 2019, National University of Singapore and Kogakuin University
  • レーザー共鳴イオン化二次中性粒子質量分析法におけるレーザー光路自動調整機構の開発
    11 Dec. 2018
  • 多色共鳴イオン化レーザーSNMSによる放射性Cs含有微粒子の分析(p27)
    05 Dec. 2018
  • ディーゼルすす粒子の溶解成分の分析(p28)
    05 Dec. 2018
  • SEM画像を用いた大気微粒子粒子の形状識別と分類(p29)
    05 Dec. 2018
  • TOF-SIMSによるがん組織切片凍結分析のための試料調製法の検討(p30)
    05 Dec. 2018
  • 多色共鳴イオン化レーザーSNMSの画質向上に関する研究
    01 Nov. 2018
  • 質量イメージング顕微鏡の開発と生体応用 ～その可能性と展望～
    06 Oct. 2018, [Invited]
  • ToF-SIMSをもちいた悪性度評価と次世代低侵襲治療のための肺癌のバ,イオマーカー
    06 Oct. 2018
  • Pt系抗がん剤のがん細胞内部での試薬分布の可視化
    06 Oct. 2018, [Invited]
  • レーザー共鳴イオン化を用いた多元素迅速同位体分析法の開発(K10)
    22 Sep. 2018
  • 共鳴イオン化SNMS法の開発と放射性微粒子分析への応用(K08)
    22 Sep. 2018
  • 高繰り返し率グレーティング型Ti:Sapphire レーザーにおける発振パルス時間モニタリングシステムの開発 (20p-PB5-84)
    20 Sep. 2018
  • 2種類のケイ酸化合物からなる放射性粒子に対する組成分析(P37)
    19 Sep. 2018
  • 同位体マイクロイメージングのためのレーザー共鳴イオン化-二次中性粒子共鳴イオン化質量分析法の開発 (18p-231B-7)
    18 Sep. 2018
  • Development of new Ti:sapphire based laser sources for selective ionization and spectroscopy applications
    Volker Sonnenschein; Hideki Tomita; Kotaro Kato; Kosuke Saito; Shoma Kokuryu; So Suzuki; Taku Matsushita; Tetsuo Iguchi; Tetsuo Sakamoto; Yoshiyuki Tsuji
    International Conference on Electromagnetic Isotope Separators and Related Topics, 16 Sep. 2018, International Union of Pure and Applied Physics
  • 黄砂など粒子状物質が循環器疾患に及ぼす短期曝露影響に関する研究（シンポジウム「越境粒子状物質の健康影響」）
    13 Sep. 2018
  • 放射性核種の微小領域同位体イメージングのためのレーザー共鳴イオン化-二次中性粒子質量分析法の開発(3) (2A-05)
    06 Sep. 2018
  • 難分析核種の高感度分析のための多色イオン化光源の開発 (Se-5)
    05 Sep. 2018
  • 放射性セシウムをミクロな視野で同位体別に可視化するレーザー共鳴イオン化質量顕微鏡 (K-09)
    30 Aug. 2018
  • 共鳴イオン化を用いた多元素迅速同位体分析のためのグレーティング型Ti:sapphireレーザー制御システムの開発 (P1)
    07 Aug. 2018
  • 環境微粒子中放射性核種同位体分析のためのレーザー共鳴イオン化-二次中性粒子質量分析法の開発 (2p-III-03)
    04 Jul. 2018
  • Dialysis Analysis of Aerosol using TOF-SIMS (P12)
    M. Fujisawa; M. Morita and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS20), 28 Jun. 2018, JSPS 141th committee
  • Development of a novel analysis technique by TOF-SIMS for the visualization of cell structure with high spatial resolution (P11)
    T. Hasegawa; M. Morita and T. Sakamoto
    International Conference on Electromagnetic Isotope Separators and Related Topics (SISS20), 28 Jun. 2018, JSPS 141th Committee
  • Analysis of Cesium Distribution in Water-Containing Plant by TOF-SIMS (P13)
    Y. Miyashita; H. Koide; K. Kanenari; M. Morita and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS20), 28 Jun. 2018
  • Matrix and Element Dependences of Useful Yield in Si and SiO2 Matrices Using Laser-Ionization Sputtered Neutral Mass Spectrometry (P7)
    R.Saito; H. Akutsu; J. Asakawa; S. Takeno; A. Takano; T. Sakamoto and M. Fujii
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS20), 28 Jun. 2018
  • 多色共鳴イオン化SNMSによる福島における放射性物質の同位体識別イメージング (pp.48~53)
    17 May 2018
  • PM2.5や黄砂などの大気微粒子の１粒子ごとの成分イメージング装置の開発
    08 May 2018, [Invited]
  • 応用物理学科・物質計測制御研究室紹介 (D31)
    25 Apr. 2018
  • 放射性核種の微量領域同位体イメージングのためのレーザー共鳴イオン化-二次中性子共鳴イオン化質量分析法の開発(2) (3H05)
    28 Mar. 2018
  • Micro Isotope Imaging by Resonant Laser - Secondary Neutral Mass Spectrometry (O-14)
    Hideki Tomita; Kosuke Saito; Masaya; Masaya Oohashi; Volker Sonnenschein; Masato Morita; Tetsuo Sakamoto; Keita Kanenari; Kotaro Kato; Sou Suzuki; Tetsuo Iguchi; Toshihide ToshihideKawai; Takeo Okumura
    International Symposium on Radiation Detectors and Their Uses (ISRD2018), 24 Jan. 2018, ISRD2018 Organizing Committee (KEK and JSPS186th Committee on Radiation Science and Its Applications
  • レーザーイオン化スパッタ中性粒子質量イメージング装置の開発と環境微粒子、機能性材料への応用（招待講演）（E124aIII02)
    24 Jan. 2018
  • PM2.5や黄砂などの大気微粒子の1粒子ごとの成分イメージング装置の開発,～粒子の正体を解明かす最先端アプローチ～
    13 Dec. 2017
  • 含水状態の単一細胞の SIMS 分析に向けた手法開発
    13 Dec. 2017
  • TOF-SIMSを用いた含水植物中セシウムのイメージング
    13 Dec. 2017
  • 大気圧下におけるエレクトロスプレーイオン源の開発
    13 Dec. 2017
  • Development of Multi-Color Ti:Sa Lasers for Micro-Imaging of “Difficult-to-Analysis” Nuclides by Means of Resonant Laser SNMS
    Masato Morita; K.. Kanenari; K. Saito; T. Kawai; T. Okumura; V. Sonnenschein; H. Tomita and T. Sakamoto
    11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17 (ALC17), 05 Dec. 2017, JSPS 141st Comittee
  • 個別細胞の含水状態での高空間分解能成分イメージング技術
    05 Dec. 2017
  • Development of an Ion Beam Source for SIMS in Atmospheric Pressure
    Haruka Koreeda and Tetsuo Sakamoto
    11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17 (ALC17), 04 Dec. 2017, The 141st Committee on Microbeam Analysis, Japan Society for the Promotion of Science
  • Study on Novel Biomarker Imaging Using High-resolution TOF-SIMS for the Diagnosis of Cancer Cell Malignancy
    K. Kanenari; M. Morita; M.Kakihana; N. Kajiwara; T. Ohira; N. Ikeda and T. Sakamoto
    11th International Symposium on Atomic Level Characterizations for New Materials and Devices '17 (ALC17), 04 Dec. 2017, JSPS 141st Committee
  • レーザー共鳴イオン化-二次中性粒子質量分析による微小領域同位体イメージング
    09 Nov. 2017
  • Element-Selective Imaging for Radioactive Materials by means of Resonant Laser Ionization Sputtered Neutral Mass Spectrometry
    Masato Morita; Toshihide Kawai; Takeo Okumura; Hideki Tomita; Tetsuo Sakamoto (O003)
    The 16th International Symposium on Advanced Technology (ISAT-16), 02 Nov. 2017, Kogakuin University
  • Development of ion beam by using electrospray for atmospheric SIMS (P056)
    Haruka Koreeda and Tetsuo Sakamoto
    The 16th International Symposium on Advanced Technology (ISAT-16), 02 Nov. 2017, Kogakuin University
  • Development of a Method for TOF-SIMS analysis of Hydrated Single Cell
    Takahiro Onozawa; Keita Kanenari; Masato Morita and Tetsuo Sakamoto
    The 16th International Symposium on Advanced Technology (ISAT-16), 02 Nov. 2017, Kogakuin University
  • 広帯域波長可変チタンサファイアレーザーを用いたアクチノイド元素の共鳴イオン化スキーム開発 (3L06)
    15 Sep. 2017
  • 放射性核種の微小領域同位体イメージングのためのレーザー共鳴イオン化-二次中性粒子質量分析法の開発 (2N04)
    14 Sep. 2017
  • Matrix and Element Dependences of Ionisation Yield in Laser-SNMS (PB2-Thu-P59)
    Reiko Saito; Haruko Akutsu; Jun Asakawa; Shiro Takeno; Satoru Nagashima; Takeharu Ishikawa; Takahiro Kashiwagi; Akio Takano; Tetsuo Sakamoto; Masaaki Fujii
    21st International Conference on Secondary Ion Mass Spectrometry (SIMS XXI), 11 Sep. 2017
  • 植物への放射性セシウム吸収をミクロな視野で可視化する顕微鏡 (K-05)
    31 Aug. 2017
  • Pre-existing chronic kidney disease increases the risk of triggering acute myocardial infarction due to Asian dust exposure
    Sunao Kojima; Takehiro Michikawa; Kayo Ueda; Tetsuo Sakamoto; Kunihiko Matsui; Tomoko Kojima; Kenichi Tsujita; Hisao Ogawa; Hiroshi Nitta; Akinori Takami (4968)
    ESC congress (Barcelona), 29 Aug. 2017, European Society of Cardiology
  • 放射性核種マイクロイメージングのためのレーザー共鳴イオン化‐二次中性粒子質量分析法の開発
    18 Aug. 2017
  • チタンサファイアレーザーを用いた共鳴イオン化に基づく難測定放射性核種分析法の開発
    22 Jul. 2017
  • 多色イオン化光源の開発による難分析核種の高感度分析(S10-4)
    20 Jul. 2017
  • 植物中Csの微小領域イメージング(S9-2)
    20 Jul. 2017
  • Resonance Ionization Scheme Development for Actinide Elements using an Automated Wide-Range Tunable Ti:Sapphire Laser System (ThA-7)
    Hideki Tomita; Atsushi Nakamura; Daiki Matsui; Ryohei Ohtake; Volker Sonnenschein; Kosuke Saito; Kotaro Kato; Masaya Ohashi; Vincent Degner; Klaus Wendt; Ilkka Pohjalainen; Annika Voss; Sarina Geldhof; Iain Moore; Masato Morita; Tetsuo Sakamoto; Tetsu Sonoda; Mikael Reponen; Michiharu Wada; Tetsuo Iguchi
    ACTINIDES 2017, 13 Jul. 2017
  • Development of micro-imaging technique for trace analysis of radionuclide by using multicolor resonance ionization (TuB-2)
    Masato Morita; Keita Kanenari; Ryohei Ohtake; Atsushi Nakamura; Kosuke Saito; Toshihide Kawai; Takeo Okumura; Volker Sonnenschein; Hideki Tomita; Tetsuo Sakamoto
    ACTINIDES 2017, 12 Jul. 2017
  • Micro imaging analysis of cesium distribution in plant under water-containing condition by TOF-SIMS (P59)
    Keita Kanenari; Hiroki Koide; Masato Morita and Tetsuo Sakamoto
    9th International Symposium on Radiation Safety and Detection Technology (ISORD9), 12 Jul. 2017, ISORD9 Committee
  • Development of Secondary Neutral Mass Spectrometry for radioisotope micro imaging (P58)
    Kosuke Saito; Ryohei Ohtake; Kotaro Kato; Masaki Ohashi; Volker Sonnenschein; Hideki Tomita; Masato Morita; Tetsuo Sakamoto; Klaus Wendt; Tetsuo Iguchi
    9th International Symposium on Radiation Safety and Detection Technology (ISORD9), 12 Jul. 2017, ISORD9 Committee
  • 環境微粒子中放射性核種同位体分析のためのレーザー共鳴イオン化-二次中性粒子質量分析法の開発
    04 Jul. 2017
  • 超⾼分解能質量顕微鏡による細胞イメージングと肺癌の診断に関する研究
    17 Jun. 2017
  • 高分解能質量イメージング装置と環境試料、機能性材料、バイオ方面への応用
    24 May 2017
  • Introduction what FILMER can (FIB-TOF-SIMS & Laser-SNMS) do
    T. Kashiwagi; T. Ishikawa; S. Nagashima; T. Yamashita; J. Nakagawa; A. Takano; H. Takenaka; K. Endo; T. Sakamoto and M. Fujii
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-19), 11 May 2017, JSPS 141 Committee on Microbeam Analysis
  • Development of shape-classification method for aerosol particles based on image clustering
    M. Morita; K. Kanenari; and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-19), 11 May 2017, JSPS 141 Committee on Microbeam Analsyis
  • Analysis of Cesium Distribution in Plant under Frozen Condition,by TOF-SIMS
    K.Kanenari; Y. Kanemaru; M.Morita; and T.Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-19), 11 May 2017, JSPS 141 Committee on Microbeam Analysis
  • Prototype of VUV Laser-SNMS instrument for Analysis of Organic materials
    T. Ishikawa; S. Nagashima; T. Kashiwagi; T. Yamashita; A. Takano; H. Takenaka; J. Nakagawa; K. Endo; T. Sakamoto and M. Fujii
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-19), 11 May 2017, JSPS 141 Committee on Microbeam Analysis
  • チタンサファイアレーザーによる共鳴イオン化に基づく放射性核種分析法の開発II
    24 Jan. 2017
  • 高分解能質量イメージング装置の開発 ―PM2.5 を一粒ずつ分析して判ること―
    20 Dec. 2016
  • スパッタ二次中性粒子に対するレーザー共鳴イオン化の適用に関する研究
    14 Dec. 2016
  • 高面分解能レーザースパッタ中性粒子質量分析（Laser-SNMS）装置を用いた成分イメージング分析
    07 Dec. 2016
  • 凍結TOF-SIMS分析によるエアロゾル中の水分の可視化
    07 Dec. 2016
  • SEMの形状識別による黄砂の分類
    07 Dec. 2016
  • 静電噴霧堆積法によって形成した高分子薄膜の表面形態
    01 Dec. 2016
  • TOF-SIMS法による単一細胞イメージングのための凍結試料導入法
    29 Nov. 2016
  • ナノスケールマッピングに対応した二次イオン質量分析
    29 Nov. 2016
  • バルクヘテロ型有機薄膜太陽電池におけるP3HTの粒子サイズの制御
    29 Nov. 2016
  • 高分解能質量イメージング装置によるエアロゾルの個別粒子分析から判ること
    08 Nov. 2016
  • 熊本および東京にける越境汚染とローカルの識別指標 熊本および東京にける越境汚染とローカルの識別指標 (2A0945)
    08 Sep. 2016
  • 太宰府における大気汚染物質観測よ越境・地域研究（２）(2C1100)
    08 Sep. 2016
  • 九州における越境微粒子の高分解能個別析 (2C1115)
    08 Sep. 2016
  • 飛行時間型二次イオン質量分析における含水エアロゾルの分析 (2C1130)
    08 Sep. 2016
  • 放射性Zr同位体のための高分解能共鳴イオン化分光法の開発(2O22)
    08 Sep. 2016
  • 熊本および東京における越境汚染とローカル汚染の識別指標
    畠山史郎; 畠山史郎; 杉山太一; 杉山太一; 島田幸治郎; 吉野彩子; 高見昭憲; 村野健太郎; 小島知子; 坂本哲夫
    大気環境学会年会講演要旨集, 29 Aug. 2016
  • 太宰府における大気汚染物質観測による越境・地域大気汚染研究(2)
    村野健太郎; 大石興弘; 濱村研吾; 畠山史郎; 坂本哲夫; 小島知子; 三澤健太郎; 吉野彩子; 高見昭憲
    大気環境学会年会講演要旨集, 29 Aug. 2016
  • PM2.5や黄砂粒子を一つ一つ観察できる携帯型粒子捕集装置(M-24, JP-15A2)
    25 Aug. 2016
  • Latest applications on TOYAMA Laser-SNMS (O1-11)
    T. Kashiwagi; T. Ishikawa; S. Nagashima; T. Yamashita; J. Nakagawa; A. Takano; H. Takenaka and K. Endo; T. Sakamoto; M. Fujii
    18th The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS18), 21 Jul. 2016, JSPS141 committee
  • Analysis of Single Cell under the Frozen Condition by TOF-SIMS
    K.Kanenari; M.Morita; T. Onozawa and T.Sakamoto
    18th The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS18), 21 Jul. 2016, JSPS 141 committee
  • Application of FIB-TOF-SIMS for Hydrated Aerosol Particles
    Masato Morita; Keita Kanenari and Tetsuo Sakamoto
    18th The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS18), 21 Jul. 2016, JSPS 141 committee
  • Cross-sectional observation of semiconductor devices by the high spatial resolution FIB-ToF-SIMS
    H. Akutsu; R. Saito; J. Asakawa; S. Takeno; K. Kiyokawa; T. Ishikawa; T. Kashiwagi; S. Nagashima; T. Yamashita; A. Takano and T. Sakamoto
    18th The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS18), 21 Jul. 2016, JSPS 141 committee
  • 放射性セシウムのマイクロイメージングのためレーザーイオン化質量顕微鏡の開発(KS1-4)
    06 Jul. 2016
  • 福島第一原発事故後５年間の空間線量率の計測及び放射性セシウム汚染微粒子除去技術の開発と応用(1p-III-14)
    06 Jul. 2016
  • A Flange-Mounted UV Microchip Laser for Imaging Mass Spectrometry (LIC4-3, invited)
    T. Sakamoto; K. Ohishi; Y. Furukawa; L. Zheng and T. Taira
    LIC16 (The 4th Laser Ignition Conference), 19 May 2016
  • Recent developments of Ti:Sapphire laser system at Nagoya University for production of radioactive ions by resonance ionization
    H. Tomita; T. Takamatsu; D. Matsui; V. Sonnenchein; M. Reponen; A. Nakamura; R. Ohtake; K. Saito; V. Degner; R. Terabayashi; T. Sonoda; M. Wada; T. Sakamoto; P. Naubereit; K. Wendt and T. Iguchi
    X International workshop: Application of Lasers and Storage Devices in Atomic Nuclei Research, 17 May 2016
  • Application of Grating Ti:Sapphire Laser to Resonance Ionization Mass Spectrometry (2F16)
    Vincent Degner; Takahide Takamatsu; Daiki Matsui; Kousuke Saito; Atsushi Nakamura; Ryohei Ootake; Volker Sonnenschein; Hideki Tomita; Atsushi Yamazaki; Tetsuo Iguchi; Pascal Neubereit; Klaus Wendt; Tetsuo Sakamoto; Tetsu Sonoda; Michiharu Wada
    日本原子力学会・2016年春の年会, 27 Mar. 2016
  • 急速凍結TOF-SIMS分析法の開発および含水エアロゾル分析
    24 Feb. 2016
  • TOF-SIMS個別粒子解析へのクラスター分析の応用
    24 Feb. 2016
  • 急速凍結TOF-SIMS 分析法の開発と揮発性成分の分析
    04 Feb. 2016
  • 透過型グレーティング－チタンサファイアレーザーの共鳴イオン化分光への適用 (9p22)
    09 Dec. 2015
  • 共鳴イオン化のためのTi:Sapphireレーザー制御システムの開発 (9a06)
    09 Dec. 2015
  • 次世代質量イメージング用UVマイクロチップレーザーの実証実用化
    09 Dec. 2015
  • 急速凍結TOF-SIMS分析法の開発と単一細胞分析
    09 Dec. 2015
  • エレクトロスプレーデポジション法による有機薄膜の製作
    09 Dec. 2015
  • 九州における越境微粒子の高分解能TOF-SIMS分析
    09 Dec. 2015
  • 放射性物質の微小視野イメージング技術ならびに除染技術の開発 (S20)
    08 Dec. 2015
  • Individual Analysis of PM2.5 and Yellow Sands by means of a High Resolution TOF-SIMS (9-6)
    Tetsuo Sakamoto
    The 13th International Conference o Atmospheric Sciences and Applications to Air Quality (ASAAQ13), 11 Nov. 2015, The Meteorological Society of Japan
  • 高分解能イメージングTOF-SIMS装置の開発と環境微粒子への応用
    09 Nov. 2015
  • A New Method for the Analysis of Water-containing Biological Samples by TOF-SIMS (PC-22)
    Keita Kanenari; Masato Morita; Takahiro Onozawa and Tetsuo Sakamoto
    The 14th International Symposium on Advanced Technology, 02 Nov. 2015, Kogakuin University
  • Individual Analysis of Aerosol Particles using a High-Resolution TOF-SIMS (L07, pp.57-58)
    Tetsuo Sakamoto; Masato Morita; Akinori Takami; Shiro Hatakeyama; Kentaro Murano; Hisao Ogawa and Kayo Ueda
    The 14th International Symposium on Advanced Technology, 01 Nov. 2015, Kogakuin University
  • Study of Imaging Analysis for Aerosol Particles (L01)
    Masato Morita; Shojiro Tagata and Tetsuo Sakamoto
    The 14th International Symposium on Advanced Technology, 01 Nov. 2015, Kogakuin University
  • Development of a Microchip Laser for Sputtered Neutral Mass Spectrometry (L02)
    Kenji Ohishi; Tetsuo Sakamoto; Takunori Taira and Yasunori Furukawa
    The 14th International Symposium on Advanced Technology, 01 Nov. 2015, Kogakuin University
  • Selective RIMS Imaging of Radio Active Cesium by Using High Resolution TOFSIMS/SNMS Apparatus (27p-P-16)
    K. Ohishi; T. Sakamoto; T. Okumura and I. Kawakami
    10th International Symposium on Atomic Level Characterizations,for New Materials and Devices '15, 27 Oct. 2015, The 141st Committee on Microbeam Analysi, JSPS
  • Development of a Simple System for the Analysis of Water Containing Biological Samples by TOF-SIMS (27p-P-17)
    K. Kanenari; M. Morita; K. Ohishi and T. Sakamoto
    10th International Symposium on Atomic Level Characterizations,for New Materials and Devices '15, 27 Oct. 2015, The 141st Committee on Microbeam Analysis, JSPS
  • Cluster Analysis of Aerosol Particles with TOF-SIMS (27p-P-18)
    M. Morita; K. Kanenari; S. Tagata; K. Ohishi and T. Sakamoto
    10th International Symposium on Atomic Level Characterizations,for New Materials and Devices '15, 27 Oct. 2015, The 141st Committee on Mirobeam Analysis, JSPS
  • 光共鳴イオン化法を用いた放射性セシウム137の分析(16a-2W-8)
    16 Sep. 2015
  • 共鳴イオン化に基づく微量分析のためのグレーティングTi:Sapphire レーザーの開発
    16 Sep. 2015
  • 熊本におけるPM2.5の化学成分別連続観測(2A0900)
    16 Sep. 2015
  • 大宰府における大気汚染物質観測による越境・地域大気汚染研究(2A0945)
    16 Sep. 2015
  • 九州における越境ならびに地域汚染時のエアロゾルの粒別分析(2A1000)
    16 Sep. 2015
  • 九州北部のけるPM2.5の化学成分別分析(1E1600-2)
    15 Sep. 2015
  • 急速凍結TOF-SIMS 分析法の開発とエアロゾル中の揮発性物質の分析
    14 Sep. 2015
  • 高分解能TOF-SIMS分析装置用いたRIMS法による放射性セシウムのイメージング(J27)
    10 Sep. 2015
  • 九州北部におけるPM2.5の化学成分別分析
    三澤健太郎; 吉野彩子; 高見昭憲; 小島知子; 村野健太郎; 畠山史郎; 坂本哲夫; 上田佳代; 道川武紘; 新田裕史
    大気環境学会年会講演要旨集, 04 Sep. 2015
  • 熊本におけるPM2.5の化学成分別連続観測
    三澤健太郎; 吉野彩子; 高見昭憲; 小島知子; 村野健太郎; 畠山史郎; 坂本哲夫
    大気環境学会年会講演要旨集, 04 Sep. 2015
  • 太宰府における大気汚染物質観測による越境・地域大気汚染研究
    村野健太郎; 大石興弘; 濱村研吾; 畠山史郎; 坂本哲夫; 小島知子; 三澤健太郎; 吉野彩子; 高見昭憲
    大気環境学会年会講演要旨集, 04 Sep. 2015
  • 急速凍結TOF-SIMSによる水分を含む単一細胞の成分別三次元イメージング (M-19)
    坂本哲夫
    イノベーションジャパン2015, 27 Aug. 2015, JST, NEDO
  • 核燃料物質イメージングのための共鳴イオン化質量分析の基礎検討
    04 Aug. 2015
  • Imaging Mass Spectrometry Analysis of Aerosols by means of the High Resolution TOF-SIMS (A205)
    Tetsuo Sakamoto
    2015 Asian Aerosol Conference (AAC2015), Kanazawa, 25 Jun. 2015
  • Individual Particle Analysis of Aerosols Under Frozen Condition (P2-097)
    Keita Kanenari; Jun Ichinose; Kenji Ohishi; Tetsuo Sakamoto
    2015 Asian Aerosol Conference, 25 Jun. 2015
  • Cluster Analysis of Aerosol Particles with FIB-TOF-SIMS (P-3)
    M. Morita; K. Kanenari; S. Tagata; K. Ohishi and T. Sakamoto
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS17), 25 Jun. 2015, JSPS 141 Committee
  • PM2.5分析顕微鏡の開発と産学連携、その中での卒論生・大学院生の成長
    04 Apr. 2015
  • 共鳴イオン化(RIMS)法を用いた放射性セシウムイメージング装置の開発 (14a-C1-3)
    14 Mar. 2015
  • 放射性核種の微小部位イメージングに向けたCsレーザー共鳴イオン化スキームの開発 (11p-A19-5)
    11 Mar. 2015
  • 凍結状態でのエアロゾル分析に関する研究
    25 Feb. 2015
  • SEMを用いたエアロゾル粒子の形状分類方法の研究
    25 Feb. 2015
  • 高分解能TOF-SIMS/SNMSによる越境PM2.5の分析
    20 Feb. 2015
  • 二次イオン質量分析法(SIMS)による水素分析
    27 Jan. 2015
  • 放射性Csの検出に向けた高選択イオン化分析装置の開発 (p.4)
    10 Dec. 2014
  • 静電スプレー法を用いた有機EL、太陽電池の製作
    10 Dec. 2014
  • TOF-SIMSによる簡易的な凍結植物試料の導入及び分析に関する研究
    10 Dec. 2014
  • 大気微粒子のSEM像による形状識別と統計データ取得
    10 Dec. 2014
  • レーザー共鳴イオン化法を用いた放射性セシウムイメージング装置の開発(pp.12-15)
    02 Dec. 2014
  • TOF-SIMS analysis of plants under frozen condition (IFAEEp4-8)
    K. Kanenari; J. Ichinose; K. Ooishi; K. Ootsuka; and T.; Sakamoto
    The 1st Innovation Forum of Advanced Enginering Education (IFAEE), 02 Nov. 2014, Kogakuin University
  • PM2.5 Classification based on Cluster Analysis of Their Shapes in SEM Images (IFAEEp4-16)
    Y. Makino; K. Ooisi; S. Tagata; K. Otsuka; and T. Sakamoto
    The 1st Innovation Forum of Advanced Enginering Education (IFAEE), 02 Nov. 2014, Kogakuin University
  • Fabrication of Organic LED using Electro-Spray Deposition Method (IFAEEp4-19)
    Y. Maekubo; R. Anegawa; S. Kikukawa; S. Suemura; E. Yoshiya; Sugimoto; Y. Nishiyama; and T. Sakamoto
    The 1st Innovation Forum of Advanced Enginering Education (IFAEE), 02 Nov. 2014, Kogakuin University
  • Individual Analysis of PM2.5 by means of High-Resolution,Time-of-Flight Secondary Ion Mass Spectrometry (IFAEE3)
    Tetsuo Sakamoto
    The 1st Innovation Forum of Advanced Enginering Education (IFAEE), 01 Nov. 2014, Kogakuin University
  • ESD法を用いた有機薄膜素子の平膜化の検討(C-13-4)
    23 Sep. 2014
  • TOF-SIMSによる簡易的な凍結植物試料の導入法及び分析に関する研究(H3010Y)
    19 Sep. 2014
  • 福島におけるエアロゾルの個別粒子分析(1A0930)
    17 Sep. 2014
  • 大気微粒子のSEM像による形状識別と統計データ取得(1A0945)
    17 Sep. 2014
  • PM2.5粒子を1つずつ成分イメージング可能な質量顕微鏡
    11 Sep. 2014
  • 放射性セシウムの微小領域イメージング技術の開発
    04 Sep. 2014
  • 放射性物質の微小領域イメージングシステム
    03 Sep. 2014
  • PM2.5個別粒子分析のための高分解能TOF-SIMS装置の開発と越境微粒子分析への応用
    31 Jul. 2014
  • 荷電凝集ろ過法による農業用水からの放射性セシウム汚染懸濁粒子の除去(3a-I-04)
    09 Jul. 2014
  • PM2.5を１粒子ごとに分析できる新顕微鏡
    26 May 2014
  • SEMを用いた大気微粒子の形状識別と統計データ取得方法の研究 (B1012)
    24 May 2014
  • Nano-Scale Imaging Mass Spectrometry using a Combination of Focused Ion Beam and UV-Laser (LIC4-1) (invited)
    Tetsuo Sakamoto
    The 2nd Laser Ignition Conference 2014 (LIC’14), 23 Apr. 2014, LSJ, The Laser Society of Japan
  • Investigation of Post-Ionizations of Sputtered Atoms in TOF-MS Using a Palm-Top-Size Megawatt Microlaser (LIC4-2)
    J. Gao; T. Sakamoto; R. Bhandari; T. Taira; S. Ishiuchi; Y. Furukawa
    The 2nd Laser Ignition Conference 2014 (LIC’14), 23 Apr. 2014, LSJ, The Laser Society of Japan
  • セシウム添加土壌において栽培された稲の分析(17a-F4-5)
    17 Mar. 2014
  • 二段階引出によるTOF-SIMSの質量分解能向上(17a-F4-9)
    17 Mar. 2014
  • SEMを用いたエアロゾルの形状識別と粒子カウンティングに関する研究
    04 Mar. 2014
  • 放射性物質の高分解能３次元・直接イメージング技術の開発
    20 Feb. 2014
  • 植物石などに含まれる放射性セシウムのRIMSイメージング装置の開発
    31 Jan. 2014
  • コンセントとプラグ間で発生するシンチレーション時の表面温度・電流特性
    07 Jan. 2014
  • 帯電した人体の動きによって発生する誘導電圧を利用した動作判別
    07 Jan. 2014
  • Nano-Scale Imaging Mass Spectrometry using a Combination of Focused Ion Beam and UV-Laser (LIC4-1) (invited)
    2014
  • Investigation of Post-Ionizations of Sputtered Atoms in TOF-MS Using a Palm-Top-Size Megawatt Microlaser (LIC4-2)
    2014
  • Laser-SNMS Analysis of Organic Compounds at Multifunctional FIB-TOF-SIMS
    T. Ishikawa; S. Nagashima; T. Kashiwagi; J. Nakagawa; K. Endo; T. Sakamoto; K. Misawa; M. Miyazaki and M. Fujii
    6th International Symposium on Practical Surface Analysis (PSA-13), 13 Nov. 2013, Surface Analysis Society of Japan
  • Investigation of the surface degradation of LiCoO2 particles in the cathode materials of Li-ion batteries
    M. Ohnishi; O. Matsuoka; H. Nogi and T. Sakamoto
    6th International Symposium on Practical Surface Analysis (PSA-13), 12 Nov. 2013, Surface Analysis Society of Japan
  • Stable Emission and Nano-particle Formation of P3HT in Electrospray Deposition for Fabrication of Organic Solar Cell (7P-7-83)
    S. Baba; T. Kimura; N. Yamaguchi and T. Sakamoto
    26th International Microprocesses and Nanotechnology Conference (MNC2013), 07 Nov. 2013, The Japan Society of Applied Physics
  • Fabrication of OLED using Needle-Electro-Spray Deposition
    T. Okada; S. Izawa; S. Tutamori and T. Sakamoto
    26th International Microprocesses and Nanotechnology Conference (MNC2013), 07 Nov. 2013, The Japan Society of Applied Physics
  • 有機物・ポリマーのための質量顕微鏡の開発
    18 Oct. 2013
  • 高分解能TOF-SIMSによる越境エアロゾル粒子の個別粒子分析
    11 Oct. 2013
  • 越境大気微粒子(PM2.5)の個別粒子分析
    03 Oct. 2013
  • Introduction of Multifunctional FIB TOF-SIMS
    Takeharu Ishikawa; Satoru Nagashima; Takahiro Kashiwagi; Jun Nakagawa; Katsumi Endo; Tetsuo Sakamoto and Masaaki Fujii
    SIMS XIX - 19th International Conference on Secondary Ion Mass Spectrometry, 30 Sep. 2013
  • 有機薄膜太陽電池におけるバルクヘテロ構造作成のためのエレクトロスプレー法の検討(C-13-7)
    20 Sep. 2013
  • Needle-ESDによる有機ELの成膜(C-13-8)
    20 Sep. 2013
  • 凍結試料の迅速な簡易導入法の試行 -放射性セシウム含有植物の分析に向けて-
    19 Sep. 2013
  • 福江島で観測された粒子状物質の高濃度事例の粒別解析(2D1100)
    19 Sep. 2013
  • 福江島で観測された粒子状物質の高濃度事例の解析
    19 Sep. 2013
  • 長崎福江島におけるフィルターパック法による粗大粒子と微小粒子の観測（Ⅲ）
    19 Sep. 2013
  • NOy･全硝酸連続観測および粒子拡散解析による発生源推定の試み
    19 Sep. 2013
  • セシウム含有自然起源試料のSIMS分析
    16 Sep. 2013
  • TOF-SIMSによる放射性物質の直接イメージング技術の開発について
    13 Sep. 2013
  • TOF-SIMS, Laser-SNMS分析法による凍結植物試料の簡易導入法 -凍結試料の迅速な試料導入法の試行-
    11 Sep. 2013
  • Structural analysis of fine particles using a Time-of-Flight Secondary Ion Mass Spectrometer
    A. Takami; N. Mayama; T. Sakamoto; K. Ohishi; S. Irei; A. Yoshino; S. Hatakeyama; K. Murano; Y. Sadanaga; H. Bandow; K. Misawa; M. Fujii
    European Aerosol Conference (EAC2013), 02 Sep. 2013, Czech Aerosol Society
  • ソフトブラスト法による外壁等からの放射性セシウム結合植物石・雲母等の除去
    29 Aug. 2013
  • 質量分析法を用いたエアロゾル粒子の構造解析 1
    27 Aug. 2013
  • 質量分析法を用いたエアロゾル粒子の構造解析 2
    27 Aug. 2013
  • Development of the Rapid and Easy Way to Introduce the Frozen Samples to Analysis Chamber (1L-PO41)
    Kenji Ohishi; Tetsuo Sakamoto; Takeo Okumura and Isamu Kawakami
    ANALYSIS XII (The Twelfth Asian Conference on Analytical Sciences), 22 Aug. 2013, The Japan Society for Analytical Chemistry
  • 装置のコンセプトと特徴
    19 Jul. 2013
  • エアロゾル分析への応用
    19 Jul. 2013
  • 単一微粒子履歴解析装置によるPM2.5粒子の分析 ～現状と分析機器用レーザー光源への期待～ (pp.13-20)
    18 Jul. 2013
  • FIB-TOF-SIMS装置による環境試料中のセシウムの存在形態に関する研究
    03 Jul. 2013
  • Short Circuit Current by Difference of Gap Length between Electrical Outlet and Tracking Resistance Plug
    Shota Yuyama; Norimitsu Ichikawa; and Tetsuo Sakamoto
    2013 Annual Meeting of the Electrostatics Society of America, 13 Jun. 2013, Electrostatics Society of America
  • Determination in Operation by the Frequency Analyzing Induced Voltage Generated by the Movement of the Charged Human Body
    Masahiro Watanabe; Norimitsu Ichikawa; and Tetsuo Sakamoto
    2013 Annual meeting of the Electrostatics Society of America, 11 Jun. 2013, Electrostatics Society of America
  • Laser-SNMS におけるレーザー照射条件の最適化 (F1003)
    18 May 2013
  • A new aspect of Laser-SNMS coupled with Ga FIB for polymer analysis (O2-16, pp.81-82, invited)
    Tetsuo SAKAMOTO
    The Scientific International Symposium on SIMS and Related Techniques Based on Ion-solid Interations SISS-15, 26 Apr. 2013, JSPS 141 committee
  • FIB-TOF-SIMSによる界面活性剤の分析 (28A-PA2-13)
    28 Mar. 2013
  • Needle-ESD法による有機ELの成膜（C-13-2）
    20 Mar. 2013
  • 有機薄膜電池作製のためのNeedle-ESD法の検討(C-13-13)
    20 Mar. 2013
  • エレクトロスプレー堆積法による有機EL、有機太陽電池の作製方法の開発（CS-4-4）
    20 Mar. 2013
  • Laser-SNMSにおけるレーザー照射条件の最適化
    27 Feb. 2013
  • FIB-TOF-SIMSによるリチウム電池正極粒子表面の劣化物質の評価（Powell賞受賞記念講演）
    21 Feb. 2013
  • Laser-SNMSによる有機物分析
    21 Feb. 2013
  • Analysis of black carbon particles by high-resolution TOF-SIMS
    2013
  • Analysis of source apportionment and chemical transformation of particles in trans-boundary air pollution using high lateral resolution imaging SIMS
    2013
  • Laser post-ionization mass spectrometry of PAHs on diesel soot particles
    2013
  • Development of FIB-TOF-SIMS Apparatus and Application to Aerosol Particle Analysis
    2013
  • Analysis of LiCoO2, CoO, and Co3O4 using FIB-TOF-SIMS
    2013
  • A new aspect of Laser-SNMS coupled with Ga FIB for polymer analysis (O2-16, pp.81-82, invited)
    2013
  • Determination in Operation by the Frequency Analyzing Induced Voltage Generated by the Movement of the Charged Human Body
    2013
  • Short Circuit Current by Difference of Gap Length between Electrical Outlet and Tracking Resistance Plug
    2013
  • ソフトブラスト法による外壁等からの放射性セシウム結合植物石・雲母等の除去
    2013
  • Development of the Rapid and Easy Way to Introduce the Frozen Samples to Analysis Chamber (1L-PO41)
    2013
  • Structural analysis of fine particles using a Time-of-Flight Secondary Ion Mass Spectrometer
    2013
  • Introduction of Multifunctional FIB TOF-SIMS
    2013
  • Stable Emission and Nano-particle Formation of P3HT in Electrospray Deposition for Fabrication of Organic Solar Cell (7P-7-83)
    2013
  • Fabrication of OLED using Needle-Electro-Spray Deposition
    2013
  • Investigation of the surface degradation of LiCoO2 particles in the cathode materials of Li-ion batteries
    2013
  • Laser-SNMS Analysis of Organic Compounds at Multifunctional FIB-TOF-SIMS
    2013
  • ミクロな視野で高分子材料表面を種類ごとにイメージングする新技術
    13 Dec. 2012
  • 集束イオンビーム二次イオン質量分析装置の開発と大気微粒子の個別粒子分析への応用（招待講演I）
    05 Dec. 2012
  • 集束イオンビーム二次イオン質量分析装置によるコバルト化合物のスペクトル比較(No.3)
    05 Dec. 2012
  • Supression of Deposition in Laser Post-Ionization Sputtered Neutral Mass Spectrometry of Polycyclic Aromatic Hydrocarbons on Cooling Process (pp.146-147)
    Kenji OHISHI; Norihito MAYAMA; Kentaro MISAWA; Tetsuo SAKAMOTO and Masaaki FUJII
    International Symposium on Aerosols in East Asia and Their Impacts on Plants and Human Health (ASEPH), 01 Dec. 2012, ASEPH Project (supported by MEXT)
  • Individual Analysis of Fine Aerosol Particles using High Resolution TOF-SIMS
    Norihito MAYAMA; Yusuke MIURA; Akinori TAKAMI; Tetsuo SAKAMOTO and Masaaki FUJII
    International Symposium on Aerosols in East Asia and Their Impacts on Plants and Human Health (ASEPH), 01 Dec. 2012, ASEPH project (supported by MEXT)
  • Individual Analysis of Diesel Nano-Particles using High Resolution TOF-SIMS (pp.40-41)
    Tetsuo SAKAMOTO; Kentaro MISAWA and Yuji FUJITANI
    International Symposium on Aerosols in East Asia and Their Impacts on Plants and Human Health (ASEPH), 29 Nov. 2012, ASEPH Project (supported by MEXT)
  • 高分解能TOF‐SIMSによるディーゼルナノ粒子の分析
    坂本哲夫; 三澤健太郎; 藤谷雄二
    真空に関する連合講演会講演予稿集, 14 Nov. 2012
  • FIB TOF-SIMSによるコバルト酸リチウムと酸化コバルトのスペクトル比較(14P-33)
    14 Nov. 2012
  • FABRICATION OF STACKED OLED USING ELECTRO-SPRAY DEPOSITION (P-C33-I, pp432-433)
    Takaomi Okada; Hideaki Anzai; and Tetuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Development of a Novel Fabrication Method for Organic Thin Films by Using Electro-Spray Deposition (ECEC3-4)
    Tetsuo Sakamoto; Takaomi Okada; Shunsuke Baba
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Observation of a LiCoO2 Cathode Material of a Li-ion Battery Using a Laboratory-made FIB-TOF-SIMS (P-B3-1-II)
    M. Ohnishi; O. Matsuoka; H. Nogi; and T. Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Investigation of Safety on Tracking Resistance Plug Used in a Home (P-C32-I)
    Shota Yuyama; Norimitsu Ichikawa; Tetsuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Operational Study of Residential Emergency Power Source Using Photovoltaic Power Generation and Battery (P-C32-I)
    Tatsuya Ueno; Norimitsu Ichikawa; Tetsuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Fabrication of Stacked OLED Using Electro-spray Deposition (P-C33-I)
    Takaomi Okada; Hideaki Anzai; Tetuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Fabrication of Organic Solar Cell in Air by Means of Electro Spray Deposition (P-C34-I)
    Shunsuke Baba; Shuuhei Kobayashi; Yuuta Maekubo; Tetsuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Optimization of Parameters in the Cluster Analysis of Small Particles Observed with SEM (P-C35-I)
    Yusuke Miura; Norihito Mayama; Tetsuo Sakamoto
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Determination of Optimal Laser Irradiating Condition in FIB-REMPI
    Takaki Sato; Kentaro Misawa; Tetsuo Sakamoto; and Masaaki Fujii
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Individual Particle Analysis of PAHs in SPM Using FIB-TOF-SIMS with Laser Ionization
    Kentaro Misawa; Kenji Ohishi; Norihito Mayama; Tetsuo Sakamoto and Masaaki Fujii
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Suppression of Deposition Phenomenon in Laser Post-ionization Sputtered Neutral Mass Spectrometry of Frozen Polycyclic Aromatic Hydrocarbons
    Kenji Ohishi; Norihito Mayama; Kentaro Misawa; Tetsuo Sakamoto and Masaaki Fujii
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Individual Analysis of Sub-micron Aerosol Particles by High Resolution TOF-SIMS
    Norihito Mayama; Yusuke Miura; Tetsuo Sakamoto and Masaaki Fujii
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • Development of Nano-Scale SIMS Imaging Apparatus for Single Particle Analysis
    Tetsuo Sakamoto; Miwa Ohnishi; Takeharu Ishikawa; Takahiro Kashiwagi; Jyun Nakagawa; and Keisuke Endo
    The 11th International Symposium on Advanced Technology, 30 Oct. 2012
  • 有機物・ポリマーのための質量顕微鏡の開発（OME-2012-49）
    17 Oct. 2012
  • 有機薄膜太陽電池におけるバルクへテロ構造の研究(OME2012-47)
    17 Oct. 2012
  • FIB-TOF-SIMSによるリチウム電池正極粒子表面の劣化物質の評価 (P-13)
    12 Oct. 2012
  • 高分解能TOF-SIMSによる大気中微粒子のクラスター分析と粒別構造解析 (P-14)
    12 Oct. 2012
  • FIB光イオン化ナノ質量イメージング装置の実用化開発
    28 Sep. 2012
  • ナノスケール質量顕微鏡 ～微粒子からバルク材料まで～
    27 Sep. 2012
  • 高分解能TOF-SIMSによる大気中微粒子のクラスター分析と粒別内部構造分析(B3003)
    21 Sep. 2012
  • 環境微粒子のレーザーポストイオン化質量分析時に生じる再付着現象(B3018)
    21 Sep. 2012
  • レーザーイオン化SIMSによるディーゼル微粒子分析(B1029)
    19 Sep. 2012
  • 越境大気微粒子の粒別分析法におけるパラメータ前処理方法の最適化の検討(Y1088)
    19 Sep. 2012
  • 大気中ナノ粒子の内部混合状態の測定(3F1426)
    14 Sep. 2012
  • Investigation of safety for tracking resistance plug (14pD-2)
    Shota YUYAMA; Norimitsu ICHIKAWA and Tetsuo SAKAMOTO
    14 Sep. 2012
  • 長崎県福江島における有機エアロゾル・エアロゾル金属成分の季節変化(2E0900)
    13 Sep. 2012
  • 長崎福江島におけるフィルターパック法による粗大粒子と微小粒子の観測（Ⅱ）(2E0913)
    13 Sep. 2012
  • 高分解能TOF-SIMSによる微小粒子の構造解析(2E0926)
    13 Sep. 2012
  • レーザーイオン化TOF-SIMSによる大気微粒子の構造解析(2E0939)
    13 Sep. 2012
  • 構造解析に基づいた微小粒子の生成、変質過程の推定(2E1000)
    13 Sep. 2012
  • NOy、ガス状汚染物質、後流跡線からみた福江での観測概要(2E1013)
    13 Sep. 2012
  • エレクトロスプレーによる大気中での有機薄膜太陽電池の作成(C-13-12)
    11 Sep. 2012
  • レーザーイオン化SIMSによるディーゼル微粒子分析
    三澤健太郎; 坂本哲夫; 藤谷雄二; 藤井正明
    日本分析化学会年会講演要旨集, 05 Sep. 2012
  • 大気中ナノ粒子の内部混合状態の測定
    藤谷雄二; 坂本哲夫; 三澤健太郎
    大気環境学会年会講演要旨集, 29 Aug. 2012
  • 太陽光発電と蓄電池を用いた住宅用防災電源システムの運転方法の検討(I-21)
    23 Aug. 2012
  • FIB TOF-SIMS を用いたLi イオン電池正極表面の観察
    15 Jul. 2012
  • JSTプロジェクトの概要
    04 Jul. 2012
  • 単一微粒子測定装置の開発と基礎的な応用
    30 Jun. 2012
  • Fabrication of Stacked OLED using Electro-Spray Deposition (P-2)
    Takaomi OKADA; Tetsuo SAKAMOTO and Hideaki ANZAI
    The 7th International Symposium on Organic Molecular Electronics (ISOME2012), 07 Jun. 2012, The Electronics Society of IEICE
  • Analysis of Sub-micron Aerosol Particles by High Resolution TOF-SIMS (P-6)
    Norihito MAYAMA; Yusuke MIURA; Tetsuo SAKAMOTO and Masaaki FUJII
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14), 31 May 2012
  • Observation of a LiCoO2 cathode material of a Li-ion Battery using TOF-SIMS (P3)
    Miwa OHNISHI; Osamu MATSUOKA; Nidenobu NOGI and Tetsuo SAKAMOTO
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14), 31 May 2012, Microbeam Analysis 141st Committee (JSPS)
  • Laser Post Ionization Mass Spectrometry of PAHs on Diesel Soot Particles (P-8)
    Kenji OHISHI; Norihito MAYAMA; Kentaro MISAWA; Tetsuo SAKAMOTO and Masaaki FUJII
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-14), 31 May 2012, Microbeam Analysis 141st Committee (JSPS)
  • FIB・レーザーイオン化質量分析による有機物の局所分析
    24 May 2012
  • エレクトロスプレー堆積法による積層型有機ELの製作
    24 May 2012
  • SEMによる形状観察とクラスター分析を用いた越境大気微粒子の粒別分析法の検討 (Y1218)
    19 May 2012
  • 高分解能TOF-SIMSを用いたプラントオパール中放射性セシウムのイメージング法の開発
    10 May 2012
  • Laser-SNMS 分析における高繰り返しUVレーザー集光の最適化 (1D1-34)
    25 Mar. 2012
  • 高分解能TOF-SIMS によるディーゼルナノ粒子の粒別分析 (1D1-41)
    25 Mar. 2012
  • 高分解能TOF-SIMSを用いた 大気微粒子中のブラックカーボンの探索 (1D1-36)
    25 Mar. 2012
  • カリウム担持バイオマスの炭化物表面の高面分解能TOF-SIMS分析
    25 Mar. 2012
  • リチウムイオン電池正極表面のTOF-SIMSによる観察
    25 Mar. 2012
  • エレクトロスプレーデポジッション法の基礎的性質の検討とその応用 (17p-GP8-2)
    17 Mar. 2012
  • ディーゼルすすに含まれる多環芳香族(PAHs) のレーザーポストイオン化質量分析 (16p-DP1-9)
    16 Mar. 2012
  • TOF 二次イオン質量分析のための非破壊的イオンビーム照射位置決め法
    16 Mar. 2012
  • FIB-TOF-SIMSによる微細炭素繊維材料の断面加工と分析 (15p-B11-5)
    15 Mar. 2012
  • 高分解能TOF‐SIMSによるディーゼルナノ粒子の粒別分析
    坂本哲夫; 三澤健太郎; 藤谷雄二
    日本化学会講演予稿集, 09 Mar. 2012
  • SEMによる形状観察とクラスター分析を用いた越境大気微粒子の粒別分析法の検討
    02 Mar. 2012
  • 単一微粒子内部構造解析装置による越境汚染微粒子の起源・履歴解明（特別講演）
    02 Mar. 2012
  • Internal mixture of diesel nanoparticles from FIB-SIMS microscopy
    Yuji Fujitani; Tetsuo Sakamoto and Kentaro Misawa
    International symposium on aerosol studies explored by electron microscopy, 16 Feb. 2012, Meteorological Research Institute
  • Analysis of Black Carbon Particles by High Resolution TOF-SIMS (P7)
    Norihito MAYAMA; Yusuke MIURA; Kenji OHISHI; Tetsuo SAKAMOTO and Masaaki FUJII
    International symposium on aerosol studies explored by electron microscopy, 16 Feb. 2012, Meteorological Research Institute
  • Laser Post Ionization Mass Spectrometry of PAHs on Diesel,Soot Particles and its Optimization (P6)
    Kenji OHISHI; Norihito MAYAMA; Kana KITATSUGU; Kentaro MISAWA; Tetsuo SAKAMOTO and Masaaki FUJII
    International symposium on aerosol studies explored by electron microscopy, 16 Feb. 2012, Meteorological Research Institute
  • Analysis of Source Apportionment and Chemical Transformation of Particles in Trans-Boundary,Air-Pollution Using a High Lateral Resolution Imaging-SIMS (P8)
    Tetsuo Sakamoto; Kenji Ohishi; Yusuke Miura; Masaaki Fujii; Kentaro Misawa; Norihito Mayama; Mikko Riese; Kana Kitatsugu; Akinori Takami; Satoshi Irei; Shiro Hatakeyama; Ayako Yoshino; Kentaro Murano; Takuma Mukaida; Hiroshi Bandow and Yasuhiro Sadanaga
    International symposium on aerosol studies explored by electron microscopy, 16 Feb. 2012, Meteorological Research Institute
  • 2E0926 Structure Analysis of Fine Particles by High Resolution TOF-SIMS(1 Space-5 East Asia,General Presentations)
    MAYAMA Norihito; MIURA Yusuke; YOSHINO Ayako; MISAWA Kentaro; SAKAMOTO Tetsuo; TAKAMI Akinori; HATAKEYAMA Shiro; BANDOW Hiroshi; MURANO Kentaro; FUJII Masaaki
    2012
  • 2E1000 A process study for fine particles based on the SIMS analysis(1 Space-5 East Asia,General Presentations)
    TAKAMI Akinori; MAYAMA Norihito; SAKAMOTO Tetsuo; OHISHI Kenji; IREI Satoshi; MIYOSHI Takao; MURANO Kentaro; HATAKEYAMA Shiro; YOSHINO Ayako; BANDOW Hiroshi; SADANAGA Yasuhiro; MISAWA Kentaro; FUJII Masaaki
    2012
  • Internal mixture of diesel nanoparticles from FIB-SIMS microscopy
    2012
  • Laser Post Ionization Mass Spectrometry of PAHs on Diesel Soot Particles and its Optimization (P6)
    2012
  • Analysis of Black Carbon Particles by High Resolution TOF-SIMS (P7)
    2012
  • Analysis of Source Apportionment and Chemical Transformation of Particles in Trans-Boundary Air-Pollution Using a High Lateral Resolution Imaging-SIMS (P8)
    2012
  • Analysis of Sub-micron Aerosol Particles by High Resolution TOF-SIMS (P-6)
    2012
  • Observation of a LiCoO2 cathode material of a Li-ion Battery using TOF-SIMS (P3)
    2012
  • Laser Post Ionization Mass Spectrometry of PAHs on Diesel Soot Particles (P-8)
    2012
  • Fabrication of Stacked OLED using Electro-Spray Deposition (P-2)
    2012
  • FABRICATION OF STACKED OLED USING ELECTRO-SPRAY DEPOSITION (P-C33-I, pp432-433)
    2012
  • Development of a Novel Fabrication Method for Organic Thin Films by Using Electro-Spray Deposition (ECEC3-4)
    2012
  • Observation of a LiCoO2 Cathode Material of a Li-ion Battery Using a Laboratory-made FIB-TOF-SIMS (P-B3-1-II)
    2012
  • Investigation of Safety on Tracking Resistance Plug Used in a Home (P-C32-I)
    2012
  • Operational Study of Residential Emergency Power Source Using Photovoltaic Power Generation and Battery (P-C32-I)
    2012
  • Fabrication of Stacked OLED Using Electro-spray Deposition (P-C33-I)
    2012
  • Fabrication of Organic Solar Cell in Air by Means of Electro Spray Deposition (P-C34-I)
    2012
  • Optimization of Parameters in the Cluster Analysis of Small Particles Observed with SEM (P-C35-I)
    2012
  • Determination of Optimal Laser Irradiating Condition in FIB-REMPI
    2012
  • Individual Particle Analysis of PAHs in SPM Using FIB-TOF-SIMS with Laser Ionization
    2012
  • Suppression of Deposition Phenomenon in Laser Post-ionization Sputtered Neutral Mass Spectrometry of Frozen Polycyclic Aromatic Hydrocarbons
    2012
  • Individual Analysis of Sub-micron Aerosol Particles by High Resolution TOF-SIMS
    2012
  • Development of Nano-Scale SIMS Imaging Apparatus for Single Particle Analysis
    2012
  • Individual Analysis of Diesel Nano-Particles using High Resolution TOF-SIMS (pp.40-41)
    2012
  • Supression of Deposition in Laser Post-Ionization Sputtered Neutral Mass Spectrometry of Polycyclic Aromatic Hydrocarbons on Cooling Process (pp.146-147)
    2012
  • Individual Analysis of Fine Aerosol Particles using High Resolution TOF-SIMS
    2012
  • ミクロな視野で高分子材料表面を種類ごとにイメージングする新技術
    2012
  • Laser Post Ionization Mass Spectrometry of PAHs on Diesel Soot Particles and its Optimization (P6)
    International symposium on aerosol studies explored by electron microscopy, 2012
  • Analysis of Source Apportionment and Chemical Transformation of Particles in Trans-Boundary Air-Pollution Using a High Lateral Resolution Imaging-SIMS (P8)
    International symposium on aerosol studies explored by electron microscopy, 2012
  • Investigation of safety for tracking resistance plug (14pD-2)
    2012
  • Observation of a LiCoO2 positive electrode of Li-ion Battery by High Spatial Resolution TOF-SIMS (12PA-123)
    Miwa Ohnishi; Osamu Matsuoka; Hidenobu Nogi and Tetsuo Sakamoto
    International Symposium on Surface Science (ISSS-6), 12 Dec. 2011
  • エレクトロスプレー堆積法の開発と有機EL・有機薄膜太陽電池への応用
    06 Dec. 2011
  • TOF-SIMSマッピングとクラスター分析による大気微粒子のタイプ別分析法の開発 (pp9-14)
    24 Nov. 2011
  • 高分解能TOF-SIMSを用いた微粒子粒別起源解析法の開発 (16P25)
    16 Nov. 2011
  • Fabrication of Organic,Electroluminescence Devices by Means of Electrospray Deposition (27P-11-41)
    Hideaki Anzai; Yuuki Watanabe and Tetsuo Sakamoto
    24th International Microprocesses and Nanotechnology Conference (MNC2011), 27 Oct. 2011, The Japan Society of Applied Physics
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle
    Yuji Fujitani; Tetsuo Sakamoto and Kentaro Misawa
    30th AAAR (American Association for Aerosol Research) Annual Conference, 04 Oct. 2011, American Association for Aerosol Research
  • 低電圧直流給電の配線長による放電時間への影響(H-16)
    16 Sep. 2011
  • TOF二次イオン質量分析のためのイオンビーム照射位置決めシステム (D3001Y)
    16 Sep. 2011
  • 高空間分解能TOF-SIMSによるリチウムイオン電池正極表面の観察 (D3003)
    16 Sep. 2011
  • 単一微粒子内部構造解析装置による越境汚染微粒子の起源・履歴解明 －測定原理 (3C0939)
    16 Sep. 2011
  • 長崎福江島における微小粒子の観測
    16 Sep. 2011
  • 長崎福江島におけるフィルターパックによる粗大粒子と微小粒子の観測 (3C1013)
    16 Sep. 2011
  • 長崎県福江島における有機エアロゾル・エアロゾル金属成分の観測 (3C1026)
    16 Sep. 2011
  • 後方流跡線解析から観た福江島に飛来する大気由来の年間分布と総反応性窒素酸化物(NOy)、全硝酸濃度の特徴 (3C1039)
    16 Sep. 2011
  • 福江島におけるSi基板インパクター上に捕集された大気微粒子の粒子別分析 (3C1100)
    16 Sep. 2011
  • TOF-SIMSによる越境微粒子のクラスター分析(E1008)
    14 Sep. 2011
  • 単一微粒子履歴解析装置の開発(E1009)
    14 Sep. 2011
  • 越境微粒子分析のためのサンプリング方法の検討(E1018Y)
    14 Sep. 2011
  • レーザーイオン化法によるディーゼル微粒子中の多環芳香族炭化水素の分析 －適切なレーザー波長の選定 (J1031)
    14 Sep. 2011
  • ディーゼル起源ナノ粒子内部混合状態の新しい計測法 (1A1113)
    14 Sep. 2011
  • Challenge for Investigation of Internal Mixture of Diesel Nanoparticle
    28 Aug. 2011
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle
    27 Aug. 2011
  • Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS (P6)
    Takahiro Kashiwagi; Jun Nakagawa; Tetsuo Sakamoto
    The international symposium on SIMS and related techniques based on ion-solid interactions (SISS-13), 23 Jun. 2011
  • 半揮発性物質を含む環境微粒子分析のための試料導入方法の検討
    25 Mar. 2011
  • 大気微粒子の個別分析に適した小型粒子サンプラーの開発
    24 Mar. 2011
  • 越境微粒子の無機物履歴解析
    02 Mar. 2011
  • Continuous and Automatic Imaging Analysis on Cutting Cross-Sections of Particulate Matters by FIB-TOF-SIMS (P6)
    2011
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle
    2011
  • Fabrication of Organic Electroluminescence Devices by Means of Electrospray Deposition (27P-11-41)
    2011
  • Observation of a LiCoO2 positive electrode of Li-ion Battery by High Spatial Resolution TOF-SIMS (12PA-123)
    2011
  • Novel Method for Investigation of Internal Mixture of Diesel Nanoparticle
    2011
  • Challenge for Investigation of Internal Mixture of Diesel Nanoparticle
    2011
  • Fabrication of Organic Electroluminescence Devices by Means of Electrospray Deposition (27P-11-41)
    24th International Microprocesses and Nanotechnology Conference (MNC2011), 2011
  • 高分解能FIB-SIMS/SNMS装置の開発と微粒子分析への応用
    Dec. 2010
  • SEM とTOF―SIMS による画像分析を用いた微小粒子の分析法
    17 Sep. 2010
  • 越境微粒子の形状とその組成
    15 Sep. 2010
  • FIB-TOF-SIMS におけるSEM を用いた非破壊加工位置決め技術
    15 Sep. 2010
  • 単一微粒子班計画説明
    09 Jul. 2010
  • 高分解能TOF-SIMS/SNMS装置の開発と環境・材料微粒子分析への応用
    Jul. 2010
  • FIB-SIMSによる無機物履歴解析
    03 Jun. 2010
  • レーザーイオン化の固体表面イメージング分析への応用 − 表面分析からみたレーザー開発への期待 −
    22 Apr. 2010
  • 画像処理分析による沿道大気粒子の個数計測(19a-S-6)
    19 Mar. 2010
  • エレクトロスプレー法による高分子有機ELの作成(17a-ZE-7)
    17 Mar. 2010
  • エレクトロスプレー法を用いた有機薄膜の作製 -雰囲気温度の効果- (17a-ZE-8)
    01 Mar. 2010
  • FIB-TOF-SIMS/SNMSによる石炭灰単一微粒子内元素分布の観察
    25 Sep. 2009
  • 浮遊粒子状物質のTOF-SIMSおよび画像処理による分析
    10 Sep. 2009
  • エレクトロスプレー法を用いた有機薄膜の作製
    08 Sep. 2009
  • エレクトロスプレー法を用いた有機薄膜の作成
    08 Sep. 2009
  • 単一微粒子の履歴解析装置
    03 Sep. 2009
  • Development of Non-Resonant Multi Photonionization SNMS with Nd:YAG Microchip Laser
    N.Kubota; S.Nishinomiya; S.Hayashi; T.Taira; H.Ishizuki; N.Ishigaki; Y.Ido; K.Tojo; T.Sakamoto and M.Fujii
    The International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS-11), 11 Jun. 2009
  • FIB-TOF-SIMSによる石炭灰の評価
    29 Mar. 2009
  • Image Analysis of Suspended Particulate Matters for Individual Particle Analysis using TOF-SIMS
    2009
  • Optimization of Charge-Compensation in TOF-SIMS Analysis using Low-Energy Pulsed Electron Beam
    2009
  • Boron detection in suspended particulate matter by means of FIB-EB-TOF-SIMS
    2009
  • Organic Thin-Film Fabrication by Means of Electrospray Deposition
    2009
  • エレクトロスプレー法を用いた有機薄膜の作成
    2009
  • Fabrication of Organic Thin Films and Particles using Supercritical Fluids
    Tetsuo SAKAMAOTO; Itaru YAMAGUCHI and Kenji OISHI
    4th Vacuum and Surface Sciences Conference of Asia and Australia (VASSCAA-4), 29 Oct. 2008
  • Boron detection in suspended particulate matter by means of FIB-EB-ToF-SIMS
    S. Hayashi; N. Kubota; K. Mizuno; S. Kashiwakura; T. Nagasaka; T. Sakamoto
    6th European Workshop on Secondary Ion Mass Spectrometry (SIMS Europe 2008), 16 Sep. 2008
  • FIB-REMPI法による有機混合物からの多環芳香族の選択検出
    02 Sep. 2008
  • FIBスパッタ粒子の2色共鳴イオン化法の基礎検討
    30 Mar. 2008
  • ＜国際会議報告＞第16回二次イオン質量分析国際会議SIMS XVI
    25 Feb. 2008
  • Resonance Enhanced Multi-Photon Ionization of Neutral Atoms sputtered with Ga-FIB
    Masaomi KOIZUMI; Toshiyuki ITO; and Tetsuo SAKAMOTO
    16th International Coference on Secondary Ion Mass Spectrometry (SIMS XVI), 01 Nov. 2007
  • Local Charge Neutralization using Secondary Electrons induced by Focused Electron Beam in TOF-SIMS Analysis
    Tetsuo SAKAMOTO and Jyun YAMAGUCHI
    16th International Coference on Secondary Ion Mass Spectrometry (SIMS XVI), 01 Nov. 2007
  • A Portable Aerosol Sampler for Individual Particle Analysis by means of TOF-SIMS
    Jyun Yamaguchi and Tetsuo Sakamoto
    16th International Coference on Secondary Ion Mass Spectrometry (SIMS XVI), 29 Oct. 2007
  • Instrumental Factors in Resonance Enhanced Multi-Photon Ionization of FIB-Sputtered Atoms
    Tetsuo Sakamoto; Jyunji Kawasaki and Masaomi Koizumi
    16th International Conference on Secondary Ion Mass Spectrometry (SIMS XVI), 29 Oct. 2007
  • Development of a High Lateral Resolution TOF-SIMS Apparatus for Single Particle Analysis
    Tetsuo SAKAMOTO; Masaomi KOIZUMI; Jyunji KAWASAKI and Jyun YAMAGUCHI
    16th International Coference on Secondary Ion Mass Spectrometry (SIMS XVI), 29 Oct. 2007
  • 環境分析のための超微粒子の分析技術の開発
    13 Sep. 2007
  • 超臨界流体を用いた有機薄膜作成技術の開発
    05 Sep. 2007
  • Internal Energy Analysis of Atoms Sputtered with Ga-FIB
    04 Sep. 2007
  • Development of FIB-REMPI Method, Alignment of Laser Axis
    04 Sep. 2007
  • Development of a portable air sampler for individual particle analysis by TOF-SIMS
    04 Sep. 2007
  • FIB-TOF-SIMS/REMPI装置の開発状況と今後の展望
    25 Jul. 2007
  • 環境分析のための装置開発
    16 May 2007
  • FIB-REMPI装置の現状と課題
    16 Apr. 2007
  • スパッタ原子の内部状態解析
    30 Mar. 2007
  • 超臨界流体を用いた微粒子・薄膜作製法の開発（２）
    30 Mar. 2007
  • 超臨界流体組成のリアルタイム分析装置の開発
    28 Mar. 2007
  • Internal Energy Analysis of Atoms Sputtered with Ga-FIB
    2007
  • Development of FIB-REMPI Method, Alignment of Laser Axis
    2007
  • Development of a portable air sampler for individual particle analysis by TOF-SIMS
    2007
  • TOF-SIMSによるSPM粒別分析に適したサンプリング方法の検討
    22 Sep. 2006
  • 超臨界流体組成のリアルタイム分析装置の開発
    31 Aug. 2006
  • 超臨界流体を用いた有機微粒子・薄膜作製方法の開発
    29 Aug. 2006
  • 単一微粒子の履歴解析装置
    24 Jul. 2006
  • 共鳴多光子イオン化を用いたスパッタ中性粒子質量分析装置の開発,－JST先端計測分析技術・機器開発プロジェクト 収束イオンビーム／レーザーイオン化法による単一微粒子履歴解析装置－
    17 May 2006
  • 収束イオンビームとレーザーイオン化法による単一微粒子の履歴解析装置
    10 May 2006
  • 収束イオンビームとレーザーイオン化法による単一微粒子の履歴解析装置
    2006
  • 共鳴多光子イオン化を用いたスパッタ中性粒子質量分析装置の開発 －JST先端計測分析技術・機器開発プロジェクト 収束イオンビーム／レーザーイオン化法による単一微粒子履歴解析装置－
    2006
  • shave-off深さ方向分析を用いた3次元ナノスケール分析手法の開発
    18 Nov. 2005
  • 超臨界流体の特性と物質輸送への応用
    09 Nov. 2005
  • A novel sample pre-treatment method using supercritical fluids for the analysis of,atmospheric environmental samples by means of time-of-flight secondary ion mass spectrometry
    T.Sakamoto; A.Yamamoto; M.Owari and Y.Nihei
    11th European Conference on Applications of Surface and Interface Analysis (ECASIA'05), 27 Sep. 2005
  • Shave-off深さ方向分析法の様々な試料への応用
    10 Jun. 2005
  • 超臨界流体抽出法を用いた環境試料の分析前処理方法の検討
    15 May 2005
  • 超臨界流体抽出法による環境汚染物質の迅速分析法の開発
    15 May 2005
  • Shave-off深さ方向分析の故障解析への応用
    14 May 2005
  • 反応性ガス支援イオンエッチングに関する研究
    14 May 2005
  • 収束イオンビーム／レーザーイオン化法による単一微粒子の履歴解析装置 (依頼講演)
    22 Mar. 2005
  • 収束イオンビーム/レーザーイオン化法による単一微粒子の履歴解析装置 (依頼講演)
    18 Dec. 2004
  • 超臨界流体を用いた有機物の選択抽出とTOF-SIMS試料前処理への応用
    08 Dec. 2004
  • ナノビームSIMSを用いたshave-off深さ方向分析
    09 Oct. 2004
  • The shave-off depth profiling by the nano-beam SIMS
    M. Toi; A. Maekawa; T. Yamamoto; B. Tomiyasu; T. Sakamoto; M. Owari; M. Nojima and Y. Nihei
    3rd International Symposium on Practical Surface Analysis, PSA-04, 05 Oct. 2004
  • 超臨界流体抽出法における環境汚染有機化合物の抽出特性の解析
    30 Sep. 2004
  • 収束イオンビ-ム/レーザーイオン化法による単一微粒子の履歴解析装置
    03 Sep. 2004
  • 収束イオンビ-ム/レーザーイオン化法による単一微粒子の履歴解析装置 (依頼講演)
    03 Sep. 2004
  • ナノビーム SIMS 法を用いたコンタクトホール断面の分析
    16 May 2004
  • マイクロビームアナリシスによる貴金属含有浮遊粒子状物質の粒別分析法の検討
    Mar. 2004
  • 最先端の環境計測評価法
    11 Dec. 2003
  • ナノビームSIMS装置を用いた局所分析法に関する研究
    11 Dec. 2003
  • 超臨界二酸化炭素抽出法を用いた環境微粒子における多環芳香族炭化水素の迅速分析法の開発
    02 Dec. 2003
  • 超臨界抽出／質量分析法による環境汚染物質の迅速分析システムの開発
    02 Dec. 2003
  • ナノビームSIMS装置の評価
    26 Nov. 2003
  • ナノビームSIMS装置を用いた微小実用材料試料の分析
    26 Nov. 2003
  • 二次イオン質量分析法による微小領域三次元分析 (依頼講演)
    27 Oct. 2003
  • 超臨界二酸化炭素抽出における抽出物の直接分析法の開発(I)
    24 May 2003
  • 超臨界二酸化炭素抽出における抽出物の直接分析法の開発(II)
    24 May 2003
  • 塩素ガス支援微小領域 FIB 加工断面の分析
    24 May 2003
  • ナノビーム SIMS 装置の試作と評価
    24 May 2003
  • 精密有機化学の実験操作の微小化
    18 Mar. 2003
  • イオン・電子マルチビーム三次元分析装置による不織布繊維の分析
    27 Sep. 2002
  • 反応性ガス支援高速・精密微細加工システムの開発
    27 Sep. 2002
  • 実験廃棄物削減のためのマイクロラボラトリ（微小規模化学実験システム）の開発
    26 Sep. 2002
  • ナノスケールFIB-SIMS装置の試作研究 (4)
    24 Sep. 2002
  • 超臨界抽出法を用いた環境汚染物質分析の迅速化
    21 Sep. 2002
  • 超臨界二酸化炭素を用いた有機化合物群の選択抽出法の検討
    05 Jun. 2002
  • イオン・電子マルチビーム三次元分析装置を用いた飛灰粒子の表面及び内部組成分析
    03 Jun. 2002
  • O3+一次イオンによるSIMS深さ方向分析
    16 May 2002
  • 超臨界二酸化炭素抽出法を用いた有害有機物分析の迅速化
    27 Mar. 2002
  • 汎用有機化学実験操作の微小化の試み
    27 Mar. 2002
  • イオン・電子マルチビーム三次元分析装置と反応性ガス支援高速・精密微細加工システムの開発
    12 Mar. 2002
  • イオン・電子デュアル収束イオンビーム三次元分析装置を用いたニッケル水素電池材料の分析
    27 Nov. 2001
  • イオン・電子デュアル収束イオンビーム三次元分析装置によるニッケル水素電池正極材料の分析
    28 Mar. 2001
  • イオン・電子デュアル収束ビーム三次元分析装置によるボンディングワイヤー接合部の三次元分析
    30 Mar. 2000
  • イオン・電子デュアル収束ビーム三次元分析装置を用いたボンティングワイヤー／パッド接合部の分析
    Dec. 1999
  • ガリウム収束イオンビーム二次イオン質量分析法を用いた材料分析
    Sep. 1999
  • FIBを用いた三次元組成分析
    May 1999
  • ガリウム収束イオンビーム励起オージェ電子の二次元元素分析への応用
    Mar. 1999
  • イオン・電子デュアル収束ビーム三次元分析装置によるボンディングワイヤー接合部の分析
    Mar. 1999
  • 断面分析用飛行時間型二次イオン質量分析装置の開発
    Oct. 1998
  • Ga FIB励起Atomic-Likeオージェピークの考察
    Oct. 1998
  • イオン・電子デュアル収束ビームを用いた微小領域三次元分析
    Sep. 1998
  • 収束イオンビームによる断面加工法を用いた微小領域の三次元分析
    Jul. 1998
  • イオン・電子デュアル収束ビームを用いた微小領域の三次元分析
    21 Apr. 1998
  • 三次元分析のためのイオン・電子デュアル収束ビーム装置の試作(VI)
    Mar. 1998
  • Ga FIB励起オージェ電子放出における励起収率の考察
    Mar. 1998
  • 三次元分析のためのイオン・電子デュアル収束ビーム装置の試作(IV)
    Sep. 1997
  • 三次元分析のためのイオン・電子デュアル収束ビーム装置の試作(V)
    Sep. 1997
  • Ga FIB励起オージェ電子ピーク強度の入射エネルギー依存性
    Sep. 1997
  • 収束イオンビーム二次イオン質量分析法による微小部解析
    Jul. 1997
  • Ga FIBを用いた微小粒子三次元分析へのアプローチ
    23 Apr. 1997
  • Ga FIB励起オージェ電子スペクトルおよび二次元マッピング
    29 Mar. 1997
  • 三次元分析のためのイオン・電子デュアル収束ビーム装置の試作(III)
    1997
  • イオン・電子デュアル収束ビームによる三次元分析法の開発
    Oct. 1996
  • 電子・イオンデュアル収束ビーム装置の試作
    13 Sep. 1996
  • 三次元分析のためのイオン・電子デュアル収束ビーム装置の試作(II)
    09 Sep. 1996
  • イオン・電子デュアル収束ビームを用いた三次元分析装置の試作
    Sep. 1996
  • 三次元分析のための電子・イオンデュアル収束ビーム装置の試作
    28 Mar. 1996
  • 電子・イオンデュアル収束ビーム装置の試作
    1996
  • サブミクロンSIMSを用いた固体材料の局所分析
    17 Nov. 1995
  • Ga FIB SIMSにおける形状効果の計算(II)
    Oct. 1995
  • Ga FIB SIMSにおける形状効果の計算
    Mar. 1995
  • Ga FIB SIMSにおける形状効果の計算
    1995
  • Ga FIB SIMSにおける形状効果の計算(II)
    1995
  • Ga FIB SIMSにおけるGa+二次イオン強度の変化
    Sep. 1994
  • 酸素ガス導入による正二次イオン増感機構の解析(II)
    Mar. 1994
  • 酸素による正二次イオン増大機構の解析
    28 Sep. 1993
  • Ga+ FIB SIMSにおけるO2雰囲気効果(III)
    Mar. 1993
  • 斜方晶PbI2の励起子緩和
    27 Mar. 1992
  • 斜方晶PbI2の励起子とその緩和過程
    27 Sep. 1991

Industrial Property Rights

  • 特許第6856197, 特開2018-142403, 特願2017-034189, レーザー装置およびその制御方法、質量分析装置
  • 特許第6818322, 特開2018-156904, 特願2017-54691, 質量分析装置および質量分析法
  • 特許第6811962, 特開2018-190655, 特願2017-94046, 質量分析装置および質量分析方法
  • 特許第6309381号, 特開2016-24992, 特願2014-149023, 質量分析装置および質量分析法
  • 第6291647, 特開2014-200867, 特開2014-200867, 特願2013-77209, 洗浄剤、洗浄方法、および洗浄剤の処理方法
  • 第6191857, 特開2014-182938, 特願2013-56656, レーザイオン化質量分析装置
  • 特許6014801号, 特開2014-22344, 特願2012-163242, 微細部位イメージング装置
  • (審査請求済み), 特開2014-38009, 特願2012-179643, 放射性物質除去装置及び放射性物質除去方法
  • 特開2011-233249, 特願2010-099870, イオンビーム照射位置決め装置
  • 特開2011-233248, 特願2010-099869, レーザイオン化質量分析装置
  • 第4785193号, 2008-39521, 2006-212399, 集束イオンビームを用いる微細部位解析装置
  • 第4761378号, 2007-327929, 2006-161691, イオン化分析装置及びイオン化分析方法
  • 特許3404527, 2001-330571, 2000-153250, 光電子測定方法及び光電子測定システム
  • 特許3360113, 2001-266786, 2000-77003, 角度分解型入射レンズシステムを備えた電子分光器及び分光器を用いた分析方法
  • 特許3360114, 2001-266787, 2000-77070, 角度分解・リタ－ディング独立動作型入射レンズシステムを備えた電子分光器及び分光器を用いた分析方法
  • 特許3360115, 2001-266788, 2000-77071, 回折面アパチャ－透過エネルギー制御方法の角度分解型電子分光器及びこの分光器を用いた分析方法

Award

  • Sep. 2007
    Japan

Research Themes

Textbooks and teaching materials

  • 01 Sep. 2016
  • 14 Sep. 2016
  • 2002
  • 01 Sep. 2016

Social Contribution Activities

  • 01 Oct. 2016 - 31 Mar. 2024
    東京工業大学・特別研究員（クリーン環境研究ユニット）
  • 01 Apr. 2023 - Present
    法政大学イオンビーム工学研究所・兼任研究員
    organizing_member
  • 01 Apr. 2017 - 31 Mar. 2021
    東京大学生産技術研究所・リサーチフェロー
    others
  • 23 Sep. 2017 - 23 Sep. 2017
    エージェントWest出演
    appearance
  • 01 Nov. 2012 - 30 Sep. 2016
    東京工業大学ソリューション研究機構学外協力教員（クリーン環境プロジェクト）
    advisor
  • 04 Feb. 2015 - 04 Feb. 2015
    東京大学大学院工学系研究科 博士論文審査委員
    others
  • 01 Oct. 2004 - Present
    東京大学環境安全研究センター・協力研究員
    advisor

Media Coverage

  • 28 Feb. 2014
    PM2.5の成分分析
    Paper

Member History

  • Apr. 2025 - Present
    委員長
  • Apr. 2024 - Present
    幹事
  • May 2023 - Present
    正会員
  • Apr. 2023 - Present
    兼任研究員
  • Jul. 2022 - Present
    副委員長
  • Apr. 2020 - Present
    運営委員
  • Oct. 2011 - Present
    正会員
  • 2002 - Present
    正会員
  • Mar. 2000 - Present
    正会員
  • 1996 - Present
    正会員
  • 1993 - Present
    正会員
  • Apr. 2020 - Mar. 2024
    部会員
  • Mar. 2009 - Mar. 2020
    顧問幹事
  • Nov. 2012 - Mar. 2018
    東京工業大学ソリューション研究機構学外協力教員（クリーン環境プロジェクト）
  • Dec. 1999 - Mar. 2009
    幹事